APA (7th ed.) Citation

Makhdoom, S., Ren, N., Wang, C., Lin, C., Wu, Y., & Sheng, K. Comprehensive Short Circuit Behavior and Failure Analysis of 1.2kV SiC MOSFETs Across Multiple Vendors and Generations. IEEE.

Chicago Style (17th ed.) Citation

Makhdoom, Shahid, Na Ren, Ce Wang, Chaobiao Lin, Yiding Wu, and Kuang Sheng. Comprehensive Short Circuit Behavior and Failure Analysis of 1.2kV SiC MOSFETs Across Multiple Vendors and Generations. IEEE.

MLA (9th ed.) Citation

Makhdoom, Shahid, et al. Comprehensive Short Circuit Behavior and Failure Analysis of 1.2kV SiC MOSFETs Across Multiple Vendors and Generations. IEEE.