Time-resolved reflectivity technique: improvement and applications
A new method for determination of the reflectivity of Si in different phase transitions during pulsed laser irradiation is presented in this paper. This method is applied on TRR spectra of crystalline silicon (c-Si) in a medium of oxygen and amorphous hydrogenated silicon (a-Si: H). Time resolved re...
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| Main Author: | |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
1999-01-01
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| Series: | International Journal of Photoenergy |
| Online Access: | http://dx.doi.org/10.1155/S1110662X99000197 |
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