Jung, M., & Kim, D. Pseudo-Labeling and Time-Series Data Analysis Model for Device Status Diagnostics in Smart Agriculture. MDPI AG.
Chicago Style (17th ed.) CitationJung, Minwoo, and Dae-Young Kim. Pseudo-Labeling and Time-Series Data Analysis Model for Device Status Diagnostics in Smart Agriculture. MDPI AG.
MLA (9th ed.) CitationJung, Minwoo, and Dae-Young Kim. Pseudo-Labeling and Time-Series Data Analysis Model for Device Status Diagnostics in Smart Agriculture. MDPI AG.
Warning: These citations may not always be 100% accurate.