High-resolution imaging of organic and inorganic nanoparticles at nanometre-scale resolution by X-ray ensemble diffraction microscopy

High-resolution imaging of organic and inorganic nanoparticles at nanometre-scale resolution by X-ray ensemble diffraction microscopy

Coherent diffraction microscopy (CDM) is a robust direct imaging method due to its unique 2D/3D phase retrieval capacity. Nonetheless, its resolution faces limitations due to a diminished signal-to-noise ratio (SNR) in high-frequency regions. Addressing this challenge, X-ray ensemble diffraction mic...

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Bibliographic Details
Main Authors: Ning-Jung Chen, Chia-Hui Yeh, Huai-Yu Cao, Nai-Chi Chen, Chun-Jung Chen, Chun-Yu Chen, Yi-Wei Tsai, Jhih-Min Lin, Yu-Shan Huang, Chien-Nan Hsiao, Chien-Chun Chen
Format: Article
Language:English
Published: International Union of Crystallography 2025-01-01
Series:Journal of Synchrotron Radiation
Subjects:
x-ray diffraction imaging
phase retrieval algorithms
x-ray optics
ensemble diffraction microscopy
Online Access:https://journals.iucr.org/paper?S1600577524010567
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