High-resolution imaging of organic and inorganic nanoparticles at nanometre-scale resolution by X-ray ensemble diffraction microscopy
Coherent diffraction microscopy (CDM) is a robust direct imaging method due to its unique 2D/3D phase retrieval capacity. Nonetheless, its resolution faces limitations due to a diminished signal-to-noise ratio (SNR) in high-frequency regions. Addressing this challenge, X-ray ensemble diffraction mic...
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| Language: | English |
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International Union of Crystallography
2025-01-01
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| Series: | Journal of Synchrotron Radiation |
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| Online Access: | https://journals.iucr.org/paper?S1600577524010567 |
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| author | Ning-Jung Chen Chia-Hui Yeh Huai-Yu Cao Nai-Chi Chen Chun-Jung Chen Chun-Yu Chen Yi-Wei Tsai Jhih-Min Lin Yu-Shan Huang Chien-Nan Hsiao Chien-Chun Chen |
| author_facet | Ning-Jung Chen Chia-Hui Yeh Huai-Yu Cao Nai-Chi Chen Chun-Jung Chen Chun-Yu Chen Yi-Wei Tsai Jhih-Min Lin Yu-Shan Huang Chien-Nan Hsiao Chien-Chun Chen |
| author_sort | Ning-Jung Chen |
| collection | DOAJ |
| description | Coherent diffraction microscopy (CDM) is a robust direct imaging method due to its unique 2D/3D phase retrieval capacity. Nonetheless, its resolution faces limitations due to a diminished signal-to-noise ratio (SNR) in high-frequency regions. Addressing this challenge, X-ray ensemble diffraction microscopy (XEDM) emerges as a viable solution, ensuring an adequate SNR in high-frequency regions and effectively surmounting resolution constraints. In this article, two experiments were conducted to underscore XEDM's superior spatial resolution capabilities. These experiments employed 55 nm-sized silicon–gold nanoparticles (NPs) and 19 nm-sized nodavirus-like particles (NV-LPs) on the coherent X-ray scattering beamline of the Taiwan Photon Source. The core–shell density distribution of the silicon–gold NPs was successfully obtained with a radial resolution of 3.4 nm per pixel, while NV-LPs in solution were reconstructed at a radial resolution of 1.3 nm per pixel. The structural information was directly retrieved from the diffraction intensities without prior knowledge and was subsequently confirmed through transmission electron microscopy. |
| format | Article |
| id | doaj-art-7e5b32de5ba64169ba45be2c0e69f25b |
| institution | Kabale University |
| issn | 1600-5775 |
| language | English |
| publishDate | 2025-01-01 |
| publisher | International Union of Crystallography |
| record_format | Article |
| series | Journal of Synchrotron Radiation |
| spelling | doaj-art-7e5b32de5ba64169ba45be2c0e69f25b2025-01-07T14:26:38ZengInternational Union of CrystallographyJournal of Synchrotron Radiation1600-57752025-01-0132121722410.1107/S1600577524010567yn5110High-resolution imaging of organic and inorganic nanoparticles at nanometre-scale resolution by X-ray ensemble diffraction microscopyNing-Jung Chen0Chia-Hui Yeh1Huai-Yu Cao2Nai-Chi Chen3Chun-Jung Chen4Chun-Yu Chen5Yi-Wei Tsai6Jhih-Min Lin7Yu-Shan Huang8Chien-Nan Hsiao9Chien-Chun Chen10Department of Engineering and System Science, National Tsing Hua University, Hsinchu 30013, TaiwanDepartment of Physics, National Tsing Hua University, Hsinchu 30013, TaiwanDepartment of Engineering and System Science, National Tsing Hua University, Hsinchu 30013, TaiwanNational Synchrotron Radiation Research Center, Hsinchu 30076, TaiwanNational Synchrotron Radiation Research Center, Hsinchu 30076, TaiwanNational Synchrotron Radiation Research Center, Hsinchu 30076, TaiwanNational Synchrotron Radiation Research Center, Hsinchu 30076, TaiwanNational Synchrotron Radiation Research Center, Hsinchu 30076, TaiwanNational Synchrotron Radiation Research Center, Hsinchu 30076, TaiwanTaiwan Instrument Research Institute, Hsinchu 30076, TaiwanDepartment of Engineering and System Science, National Tsing Hua University, Hsinchu 30013, TaiwanCoherent diffraction microscopy (CDM) is a robust direct imaging method due to its unique 2D/3D phase retrieval capacity. Nonetheless, its resolution faces limitations due to a diminished signal-to-noise ratio (SNR) in high-frequency regions. Addressing this challenge, X-ray ensemble diffraction microscopy (XEDM) emerges as a viable solution, ensuring an adequate SNR in high-frequency regions and effectively surmounting resolution constraints. In this article, two experiments were conducted to underscore XEDM's superior spatial resolution capabilities. These experiments employed 55 nm-sized silicon–gold nanoparticles (NPs) and 19 nm-sized nodavirus-like particles (NV-LPs) on the coherent X-ray scattering beamline of the Taiwan Photon Source. The core–shell density distribution of the silicon–gold NPs was successfully obtained with a radial resolution of 3.4 nm per pixel, while NV-LPs in solution were reconstructed at a radial resolution of 1.3 nm per pixel. The structural information was directly retrieved from the diffraction intensities without prior knowledge and was subsequently confirmed through transmission electron microscopy.https://journals.iucr.org/paper?S1600577524010567x-ray diffraction imagingphase retrieval algorithmsx-ray opticsensemble diffraction microscopy |
| spellingShingle | Ning-Jung Chen Chia-Hui Yeh Huai-Yu Cao Nai-Chi Chen Chun-Jung Chen Chun-Yu Chen Yi-Wei Tsai Jhih-Min Lin Yu-Shan Huang Chien-Nan Hsiao Chien-Chun Chen High-resolution imaging of organic and inorganic nanoparticles at nanometre-scale resolution by X-ray ensemble diffraction microscopy Journal of Synchrotron Radiation x-ray diffraction imaging phase retrieval algorithms x-ray optics ensemble diffraction microscopy |
| title | High-resolution imaging of organic and inorganic nanoparticles at nanometre-scale resolution by X-ray ensemble diffraction microscopy |
| title_full | High-resolution imaging of organic and inorganic nanoparticles at nanometre-scale resolution by X-ray ensemble diffraction microscopy |
| title_fullStr | High-resolution imaging of organic and inorganic nanoparticles at nanometre-scale resolution by X-ray ensemble diffraction microscopy |
| title_full_unstemmed | High-resolution imaging of organic and inorganic nanoparticles at nanometre-scale resolution by X-ray ensemble diffraction microscopy |
| title_short | High-resolution imaging of organic and inorganic nanoparticles at nanometre-scale resolution by X-ray ensemble diffraction microscopy |
| title_sort | high resolution imaging of organic and inorganic nanoparticles at nanometre scale resolution by x ray ensemble diffraction microscopy |
| topic | x-ray diffraction imaging phase retrieval algorithms x-ray optics ensemble diffraction microscopy |
| url | https://journals.iucr.org/paper?S1600577524010567 |
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