DFDA-AD: An Approach with Dual Feature Extraction Architecture and Dual Attention Mechanism for Image Anomaly Detection
Detecting and locating unwanted structures or anomalies in the image is one of the important issues in machine vision and industrial inspection. The complexity and variability of data distribution and the lack of labeled data are among the challenges of detecting anomalies in images. In recent years...
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| Format: | Article |
| Language: | fas |
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Semnan University
2024-12-01
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| Series: | مجله مدل سازی در مهندسی |
| Subjects: | |
| Online Access: | https://modelling.semnan.ac.ir/article_9172_5e0763eb489e8328b2d7bd4639777686.pdf |
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