Large-area single-crystal indium phosphide laterally grown on patterned silicon-on-insulator

Selective area heteroepitaxy provides an alternate solution for the monolithic integration of high-performance III-V lasers on Si with effective management of crystalline defects. Here, we report large-area single-crystal InP grown on (001) patterned silicon-on-insulator (SOI) wafers using the later...

Full description

Saved in:
Bibliographic Details
Main Authors: Jie Li, Ying Xue, Ke Xu, Zengshan Xing, Kam Sing Wong, Kei May Lau
Format: Article
Language:English
Published: AIP Publishing LLC 2024-11-01
Series:APL Materials
Online Access:http://dx.doi.org/10.1063/5.0232263
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1846141139722174464
author Jie Li
Ying Xue
Ke Xu
Zengshan Xing
Kam Sing Wong
Kei May Lau
author_facet Jie Li
Ying Xue
Ke Xu
Zengshan Xing
Kam Sing Wong
Kei May Lau
author_sort Jie Li
collection DOAJ
description Selective area heteroepitaxy provides an alternate solution for the monolithic integration of high-performance III-V lasers on Si with effective management of crystalline defects. Here, we report large-area single-crystal InP grown on (001) patterned silicon-on-insulator (SOI) wafers using the lateral aspect ratio trapping (LART) method by metal-organic chemical vapor deposition. The InP grown on SOI features a length of hundreds of micrometers and a width of up to 8.5 μm with an “in-plane” configuration. Based on fine-tuned growth conditions, especially in the InP nucleation layer on the Si interface, crystalline defects have been minimized resulting in large-area high-quality materials for active devices. Growth mechanisms describing each stage of epitaxy are presented to explain the difference of lateral growth in small and large material volumes. Comprehensive material characterizations and device implementations were performed on the InP/SOI to characterize its viability as an integration platform for photonics. III-V lasers with micro-cavity and Fabry–Perot cavity were fabricated and statistically analyzed to demonstrate the feasibility of providing photonic function. Attaining large-area InP/SOI addresses the bottleneck of limited III-V material volume in selective epitaxy leading to a critical step toward monolithic integration of III-V on Si. Furthermore, the high-quality InP/SOI could serve as a mini template for regrowth to construct various photonic building blocks. Large-area and high-quality III-V on SOI here ensure LART as an easy, flexible, and tolerable method for the potential realization of fully integrated Si photonics.
format Article
id doaj-art-7402cdc082ea444daad785a4413c5f07
institution Kabale University
issn 2166-532X
language English
publishDate 2024-11-01
publisher AIP Publishing LLC
record_format Article
series APL Materials
spelling doaj-art-7402cdc082ea444daad785a4413c5f072024-12-04T17:09:06ZengAIP Publishing LLCAPL Materials2166-532X2024-11-011211111101111101-1210.1063/5.0232263Large-area single-crystal indium phosphide laterally grown on patterned silicon-on-insulatorJie Li0Ying Xue1Ke Xu2Zengshan Xing3Kam Sing Wong4Kei May Lau5Division of Emerging Interdisciplinary Area, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong KongDivision of Emerging Interdisciplinary Area, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong KongDepartment of Electronic and Computer Engineering, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong KongDepartment of Physics and William Mong Institute of Nano Science and Technology, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong KongDepartment of Physics and William Mong Institute of Nano Science and Technology, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong KongDivision of Emerging Interdisciplinary Area, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong KongSelective area heteroepitaxy provides an alternate solution for the monolithic integration of high-performance III-V lasers on Si with effective management of crystalline defects. Here, we report large-area single-crystal InP grown on (001) patterned silicon-on-insulator (SOI) wafers using the lateral aspect ratio trapping (LART) method by metal-organic chemical vapor deposition. The InP grown on SOI features a length of hundreds of micrometers and a width of up to 8.5 μm with an “in-plane” configuration. Based on fine-tuned growth conditions, especially in the InP nucleation layer on the Si interface, crystalline defects have been minimized resulting in large-area high-quality materials for active devices. Growth mechanisms describing each stage of epitaxy are presented to explain the difference of lateral growth in small and large material volumes. Comprehensive material characterizations and device implementations were performed on the InP/SOI to characterize its viability as an integration platform for photonics. III-V lasers with micro-cavity and Fabry–Perot cavity were fabricated and statistically analyzed to demonstrate the feasibility of providing photonic function. Attaining large-area InP/SOI addresses the bottleneck of limited III-V material volume in selective epitaxy leading to a critical step toward monolithic integration of III-V on Si. Furthermore, the high-quality InP/SOI could serve as a mini template for regrowth to construct various photonic building blocks. Large-area and high-quality III-V on SOI here ensure LART as an easy, flexible, and tolerable method for the potential realization of fully integrated Si photonics.http://dx.doi.org/10.1063/5.0232263
spellingShingle Jie Li
Ying Xue
Ke Xu
Zengshan Xing
Kam Sing Wong
Kei May Lau
Large-area single-crystal indium phosphide laterally grown on patterned silicon-on-insulator
APL Materials
title Large-area single-crystal indium phosphide laterally grown on patterned silicon-on-insulator
title_full Large-area single-crystal indium phosphide laterally grown on patterned silicon-on-insulator
title_fullStr Large-area single-crystal indium phosphide laterally grown on patterned silicon-on-insulator
title_full_unstemmed Large-area single-crystal indium phosphide laterally grown on patterned silicon-on-insulator
title_short Large-area single-crystal indium phosphide laterally grown on patterned silicon-on-insulator
title_sort large area single crystal indium phosphide laterally grown on patterned silicon on insulator
url http://dx.doi.org/10.1063/5.0232263
work_keys_str_mv AT jieli largeareasinglecrystalindiumphosphidelaterallygrownonpatternedsilicononinsulator
AT yingxue largeareasinglecrystalindiumphosphidelaterallygrownonpatternedsilicononinsulator
AT kexu largeareasinglecrystalindiumphosphidelaterallygrownonpatternedsilicononinsulator
AT zengshanxing largeareasinglecrystalindiumphosphidelaterallygrownonpatternedsilicononinsulator
AT kamsingwong largeareasinglecrystalindiumphosphidelaterallygrownonpatternedsilicononinsulator
AT keimaylau largeareasinglecrystalindiumphosphidelaterallygrownonpatternedsilicononinsulator