A Lightweight Laser Chip Defect Detection Algorithm Based on Improved YOLOv7-Tiny

A Lightweight Laser Chip Defect Detection Algorithm Based on Improved YOLOv7-Tiny

[Purposes] Catastrophic Optical Damage (COD) is a major limiting factor for the reliability and lifespan of high-power semiconductor lasers, making effective defect detection crucial for optimizing the manufacturing processes and structural designs of laser chips. In this study, a lightweight laser...

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Bibliographic Details
Main Authors: HU Wei, ZHAO Jumin, LI Dengao
Format: Article
Language:English
Published: Editorial Office of Journal of Taiyuan University of Technology 2025-01-01
Series:Taiyuan Ligong Daxue xuebao
Subjects:
catastrophic optical damage
semiconductor laser chip
defect detection
lightweight
model pruning
Online Access:https://tyutjournal.tyut.edu.cn/englishpaper/show-2373.html
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