Yoo, Y., Lee, H., Shin, S. H., & Kang, S. RAPID: Redundancy Analysis With Parallelized and Intelligent Distribution. IEEE.
Chicago Style (17th ed.) CitationYoo, Younwoo, Hayoung Lee, Seung Ho Shin, and Sungho Kang. RAPID: Redundancy Analysis With Parallelized and Intelligent Distribution. IEEE.
MLA (9th ed.) CitationYoo, Younwoo, et al. RAPID: Redundancy Analysis With Parallelized and Intelligent Distribution. IEEE.
Warning: These citations may not always be 100% accurate.