Unraveling the dynamics of conductive filaments in MoS2-based memristors by operando transmission electron microscopy

Abstract Advanced operando transmission electron microscopy (TEM) techniques enable the observation of nanoscale phenomena in electronic devices during operation. Here, we investigated lateral memristive devices composed of two dimensional layered MoS2 with Pd and Ag electrodes. Under external bias...

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Bibliographic Details
Main Authors: Ke Ran, Janghyun Jo, Sofía Cruces, Zhenxing Wang, Rafal E. Dunin-Borkowski, Joachim Mayer, Max C. Lemme
Format: Article
Language:English
Published: Nature Portfolio 2025-08-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-025-62592-2
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