Unraveling the dynamics of conductive filaments in MoS2-based memristors by operando transmission electron microscopy
Abstract Advanced operando transmission electron microscopy (TEM) techniques enable the observation of nanoscale phenomena in electronic devices during operation. Here, we investigated lateral memristive devices composed of two dimensional layered MoS2 with Pd and Ag electrodes. Under external bias...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Nature Portfolio
2025-08-01
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| Series: | Nature Communications |
| Online Access: | https://doi.org/10.1038/s41467-025-62592-2 |
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