Guan, H., Cai, Q., Li, X., & Sun, G. Research on a Surface Roughness Measurement Under ResNet-Based Roughness Classification and Light-Section With Seam-Driven Image Stitching (RCLS). IEEE.
Chicago Style (17th ed.) CitationGuan, Huashen, Qiushen Cai, Xiaobin Li, and Guofu Sun. Research on a Surface Roughness Measurement Under ResNet-Based Roughness Classification and Light-Section With Seam-Driven Image Stitching (RCLS). IEEE.
MLA (9th ed.) CitationGuan, Huashen, et al. Research on a Surface Roughness Measurement Under ResNet-Based Roughness Classification and Light-Section With Seam-Driven Image Stitching (RCLS). IEEE.
Warning: These citations may not always be 100% accurate.