The Effect of Microcrack Length in Silicon Cells on the Potential Induced Degradation Behavior
The presence of microcracks may lead to loss in the module output power and safety hazard of the module. This paper investigated whether the existed microscopic microcracks in cells will facilitate the PID behavior. Cells with different degrees of microcracks were fabricated into small modules to un...
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Main Authors: | Xianfang Gou, Xiaoyan Li, Shaoliang Wang, Hao Zhuang, Xixi Huang, Likai Jiang |
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Format: | Article |
Language: | English |
Published: |
Wiley
2018-01-01
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Series: | International Journal of Photoenergy |
Online Access: | http://dx.doi.org/10.1155/2018/4381579 |
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