Extraction of individual Pockels coefficients of thin films via interferometric reflection measurements

Extraction of individual Pockels coefficients of thin films via interferometric reflection measurements

Ferroelectric thin films integrated on passive photonic platforms offer ways to achieve functionalities that are otherwise impossible or inefficient, such as electro-optic (EO) modulation, acousto-optic modulation or optical nonlinear conversion. Characterization methods of the EO properties of thin...

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Bibliographic Details
Main Authors: Kobe De Geest, Enes Lievens, Ewout Picavet, Klaartje De Buysser, Dries Van Thourhout, Jeroen Beeckman
Format: Article
Language:English
Published: IOP Publishing 2025-01-01
Series:JPhys Photonics
Subjects:
Pockels effect
ferroelectric thin films
Pb(Zr,Ti)O3
BaTiO3
electro-optic modulation
Online Access:https://doi.org/10.1088/2515-7647/ada902
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