Random Illumination Microscopy: faster, thicker, and aberration-insensitive

Abstract The Extended Depth of Field (EDF) approach has been combined with Random Illumination Microscopy (RIM) to realize aberration-insensitive, fast super-resolution imaging with extended depth, which is a promising tool for dynamic imaging in larger and thicker live cells and tissues.

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Main Authors: Boya Jin, Peng Xi
Format: Article
Language:English
Published: Nature Publishing Group 2025-01-01
Series:Light: Science & Applications
Online Access:https://doi.org/10.1038/s41377-024-01687-9
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author Boya Jin
Peng Xi
author_facet Boya Jin
Peng Xi
author_sort Boya Jin
collection DOAJ
description Abstract The Extended Depth of Field (EDF) approach has been combined with Random Illumination Microscopy (RIM) to realize aberration-insensitive, fast super-resolution imaging with extended depth, which is a promising tool for dynamic imaging in larger and thicker live cells and tissues.
format Article
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institution Kabale University
issn 2047-7538
language English
publishDate 2025-01-01
publisher Nature Publishing Group
record_format Article
series Light: Science & Applications
spelling doaj-art-58095db49adb4b60bc7b028cf50e9e982025-01-05T12:46:58ZengNature Publishing GroupLight: Science & Applications2047-75382025-01-011411310.1038/s41377-024-01687-9Random Illumination Microscopy: faster, thicker, and aberration-insensitiveBoya Jin0Peng Xi1Department of Biomedical Engineering, College of Future Technology, Peking UniversityDepartment of Biomedical Engineering, College of Future Technology, Peking UniversityAbstract The Extended Depth of Field (EDF) approach has been combined with Random Illumination Microscopy (RIM) to realize aberration-insensitive, fast super-resolution imaging with extended depth, which is a promising tool for dynamic imaging in larger and thicker live cells and tissues.https://doi.org/10.1038/s41377-024-01687-9
spellingShingle Boya Jin
Peng Xi
Random Illumination Microscopy: faster, thicker, and aberration-insensitive
Light: Science & Applications
title Random Illumination Microscopy: faster, thicker, and aberration-insensitive
title_full Random Illumination Microscopy: faster, thicker, and aberration-insensitive
title_fullStr Random Illumination Microscopy: faster, thicker, and aberration-insensitive
title_full_unstemmed Random Illumination Microscopy: faster, thicker, and aberration-insensitive
title_short Random Illumination Microscopy: faster, thicker, and aberration-insensitive
title_sort random illumination microscopy faster thicker and aberration insensitive
url https://doi.org/10.1038/s41377-024-01687-9
work_keys_str_mv AT boyajin randomilluminationmicroscopyfasterthickerandaberrationinsensitive
AT pengxi randomilluminationmicroscopyfasterthickerandaberrationinsensitive