Random Illumination Microscopy: faster, thicker, and aberration-insensitive
Abstract The Extended Depth of Field (EDF) approach has been combined with Random Illumination Microscopy (RIM) to realize aberration-insensitive, fast super-resolution imaging with extended depth, which is a promising tool for dynamic imaging in larger and thicker live cells and tissues.
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Language: | English |
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Nature Publishing Group
2025-01-01
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Series: | Light: Science & Applications |
Online Access: | https://doi.org/10.1038/s41377-024-01687-9 |
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author | Boya Jin Peng Xi |
author_facet | Boya Jin Peng Xi |
author_sort | Boya Jin |
collection | DOAJ |
description | Abstract The Extended Depth of Field (EDF) approach has been combined with Random Illumination Microscopy (RIM) to realize aberration-insensitive, fast super-resolution imaging with extended depth, which is a promising tool for dynamic imaging in larger and thicker live cells and tissues. |
format | Article |
id | doaj-art-58095db49adb4b60bc7b028cf50e9e98 |
institution | Kabale University |
issn | 2047-7538 |
language | English |
publishDate | 2025-01-01 |
publisher | Nature Publishing Group |
record_format | Article |
series | Light: Science & Applications |
spelling | doaj-art-58095db49adb4b60bc7b028cf50e9e982025-01-05T12:46:58ZengNature Publishing GroupLight: Science & Applications2047-75382025-01-011411310.1038/s41377-024-01687-9Random Illumination Microscopy: faster, thicker, and aberration-insensitiveBoya Jin0Peng Xi1Department of Biomedical Engineering, College of Future Technology, Peking UniversityDepartment of Biomedical Engineering, College of Future Technology, Peking UniversityAbstract The Extended Depth of Field (EDF) approach has been combined with Random Illumination Microscopy (RIM) to realize aberration-insensitive, fast super-resolution imaging with extended depth, which is a promising tool for dynamic imaging in larger and thicker live cells and tissues.https://doi.org/10.1038/s41377-024-01687-9 |
spellingShingle | Boya Jin Peng Xi Random Illumination Microscopy: faster, thicker, and aberration-insensitive Light: Science & Applications |
title | Random Illumination Microscopy: faster, thicker, and aberration-insensitive |
title_full | Random Illumination Microscopy: faster, thicker, and aberration-insensitive |
title_fullStr | Random Illumination Microscopy: faster, thicker, and aberration-insensitive |
title_full_unstemmed | Random Illumination Microscopy: faster, thicker, and aberration-insensitive |
title_short | Random Illumination Microscopy: faster, thicker, and aberration-insensitive |
title_sort | random illumination microscopy faster thicker and aberration insensitive |
url | https://doi.org/10.1038/s41377-024-01687-9 |
work_keys_str_mv | AT boyajin randomilluminationmicroscopyfasterthickerandaberrationinsensitive AT pengxi randomilluminationmicroscopyfasterthickerandaberrationinsensitive |