Exploiting universal nonlocal dispersion in optically active materials for spectro-polarimetric computational imaging

Abstract Recent years have seen significant advancements in exploring novel light-matter interactions such as hyperbolic dispersion within natural crystals. However, current studies have predominantly concentrated on local optical response of materials characterized by a dielectric tensor without sp...

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Bibliographic Details
Main Authors: Xueji Wang, Todd Van Mechelen, Sathwik Bharadwaj, Md Roknuzzaman, Fanglin Bao, Rajib Rahman, Zubin Jacob
Format: Article
Language:English
Published: SpringerOpen 2024-12-01
Series:eLight
Online Access:https://doi.org/10.1186/s43593-024-00078-2
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Summary:Abstract Recent years have seen significant advancements in exploring novel light-matter interactions such as hyperbolic dispersion within natural crystals. However, current studies have predominantly concentrated on local optical response of materials characterized by a dielectric tensor without spatial dispersion. Here, we investigate the nonlocal response in optically-active crystals with screw symmetries, revealing their lossless, super-dispersive properties compared to traditional optical response functions. We leverage this universal nonlocal dispersion, i.e. the dispersion of optical rotatory power, to explore a novel spectral de-multiplexing scheme compared to conventional gratings, prisms and metasurfaces. We design and demonstrate an ‘Nonlocal-Cam’ - a camera that exploits nonlocal dispersion through sampling of polarized spectral states and the application of computational spectral reconstruction algorithms. The Nonlocal-Cam captures information in both laboratory and outdoor field experiments which is unavailable to traditional intensity cameras - the spectral texture of polarization. Merging the fields of nonlocal electrodynamics and computational imaging, our work paves the way for exploiting nonlocal optics of optically active materials in a variety of applications, from biological microscopy to physics-driven machine vision and remote sensing.
ISSN:2097-1710
2662-8643