Deep Learning Unravels Differences Between Kinematic and Kinetic Gait Cycle Time Series from Two Control Samples of Healthy Children Assessed in Two Different Gait Laboratories

We investigate the application of deep learning in comparing gait cycle time series from two groups of healthy children, each assessed in different gait laboratories. Both laboratories used similar gait analysis protocols with minimal differences in data collection. Utilizing a ResNet-based deep lea...

Full description

Saved in:
Bibliographic Details
Main Authors: Alfonso de Gorostegui, Damien Kiernan, Juan-Andrés Martín-Gonzalo, Javier López-López, Irene Pulido-Valdeolivas, Estrella Rausell, Massimiliano Zanin, David Gómez-Andrés
Format: Article
Language:English
Published: MDPI AG 2024-12-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/25/1/110
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We investigate the application of deep learning in comparing gait cycle time series from two groups of healthy children, each assessed in different gait laboratories. Both laboratories used similar gait analysis protocols with minimal differences in data collection. Utilizing a ResNet-based deep learning model, we successfully identified the source laboratory of each dataset, achieving a high classification accuracy across multiple gait parameters. To address the inter-laboratory differences, we explored various pre-processing methods and time series properties that may have been detected by the algorithm. We found that the standardization of the time series values was a successful approach to decrease the ability of the model to distinguish between the two centers. Our findings also reveal that differences in the power spectra and autocorrelation structures of the datasets play a significant role in the model performance. Our study emphasizes the importance of standardized protocols and robust data pre-processing to enhance the transferability of machine learning models across clinical settings, particularly for deep learning approaches.
ISSN:1424-8220