Generalized Cycle Benchmarking Algorithm for Characterizing Midcircuit Measurements

Midcircuit measurements (MCMs) are crucial ingredients in the development of fault-tolerant quantum computation. While there have been rapid experimental progresses in realizing MCMs, a systematic method for characterizing noisy MCMs is still under exploration. In this work, we develop a cycle bench...

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Bibliographic Details
Main Authors: Zhihan Zhang, Senrui Chen, Yunchao Liu, Liang Jiang
Format: Article
Language:English
Published: American Physical Society 2025-01-01
Series:PRX Quantum
Online Access:http://doi.org/10.1103/PRXQuantum.6.010310
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