Development of MHz X-ray phase contrast imaging at the European XFEL
We report on recent developments that enable megahertz hard X-ray phase contrast imaging (MHz XPCI) experiments at the Single Particles, Clusters, and Biomolecules and Serial Femtosecond Crystallography (SPB/SFX) instrument of the European XFEL facility (EuXFEL). We describe the technical implementa...
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International Union of Crystallography
2025-01-01
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| Series: | Journal of Synchrotron Radiation |
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| Online Access: | https://journals.iucr.org/paper?S160057752400986X |
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| author | Jayanath C. P. Koliyadu Daniel Moško Eleni Myrto Asimakopoulou Valerio Bellucci Šarlota Birnšteinová Richard Bean Romain Letrun Chan Kim Henry Kirkwood Gabriele Giovanetti Nerea Jardon Janusz Szuba Trey Guest Andreas Koch Jan Grünert Peter Szeles Pablo Villanueva-Perez Fabian Reuter Claus-Dieter Ohl Mike Andreas Noack Francisco Garcia-Moreno Zuzana Kuglerová-Valdová Libor Juha Martin Nikl Wataru Yashiro Hitoshi Soyama Daniel Eakins Alexander M. Korsunsky Jozef Uličný Alke Meents Henry N. Chapman Adrian P. Mancuso Tokushi Sato Patrik Vagovič |
| author_facet | Jayanath C. P. Koliyadu Daniel Moško Eleni Myrto Asimakopoulou Valerio Bellucci Šarlota Birnšteinová Richard Bean Romain Letrun Chan Kim Henry Kirkwood Gabriele Giovanetti Nerea Jardon Janusz Szuba Trey Guest Andreas Koch Jan Grünert Peter Szeles Pablo Villanueva-Perez Fabian Reuter Claus-Dieter Ohl Mike Andreas Noack Francisco Garcia-Moreno Zuzana Kuglerová-Valdová Libor Juha Martin Nikl Wataru Yashiro Hitoshi Soyama Daniel Eakins Alexander M. Korsunsky Jozef Uličný Alke Meents Henry N. Chapman Adrian P. Mancuso Tokushi Sato Patrik Vagovič |
| author_sort | Jayanath C. P. Koliyadu |
| collection | DOAJ |
| description | We report on recent developments that enable megahertz hard X-ray phase contrast imaging (MHz XPCI) experiments at the Single Particles, Clusters, and Biomolecules and Serial Femtosecond Crystallography (SPB/SFX) instrument of the European XFEL facility (EuXFEL). We describe the technical implementation of the key components, including an MHz fast camera and a modular indirect X-ray microscope system based on fast scintillators coupled through a high-resolution optical microscope, which enable full-field X-ray microscopy with phase contrast of fast and irreversible phenomena. The image quality for MHz XPCI data showed significant improvement compared with a pilot demonstration of the technique using parallel beam illumination, which also allows access to up to 24 keV photon energies at the SPB/SFX instrument of the EuXFEL. With these developments, MHz XPCI was implemented as a new method offered for a broad user community (academic and industrial) and is accessible via standard user proposals. Furthermore, intra-train pulse diagnostics with a high few-micrometre spatial resolution and recording up to 128 images of consecutive pulses in a train at up to 1.1 MHz repetition rate is available upstream of the instrument. Together with the diagnostic camera upstream of the instrument and the MHz XPCI setup at the SPB/SFX instrument, simultaneous two-plane measurements for future beam studies and feedback for machine parameter tuning are now possible. |
| format | Article |
| id | doaj-art-4b87f93f53cf48748a1bb00d2744d7e2 |
| institution | Kabale University |
| issn | 1600-5775 |
| language | English |
| publishDate | 2025-01-01 |
| publisher | International Union of Crystallography |
| record_format | Article |
| series | Journal of Synchrotron Radiation |
| spelling | doaj-art-4b87f93f53cf48748a1bb00d2744d7e22025-01-07T14:26:37ZengInternational Union of CrystallographyJournal of Synchrotron Radiation1600-57752025-01-01321172810.1107/S160057752400986Xyi5159Development of MHz X-ray phase contrast imaging at the European XFELJayanath C. P. Koliyadu0Daniel Moško1Eleni Myrto Asimakopoulou2Valerio Bellucci3Šarlota Birnšteinová4Richard Bean5Romain Letrun6Chan Kim7Henry Kirkwood8Gabriele Giovanetti9Nerea Jardon10Janusz Szuba11Trey Guest12Andreas Koch13Jan Grünert14Peter Szeles15Pablo Villanueva-Perez16Fabian Reuter17Claus-Dieter Ohl18Mike Andreas Noack19Francisco Garcia-Moreno20Zuzana Kuglerová-Valdová21Libor Juha22Martin Nikl23Wataru Yashiro24Hitoshi Soyama25Daniel Eakins26Alexander M. Korsunsky27Jozef Uličný28Alke Meents29Henry N. Chapman30Adrian P. Mancuso31Tokushi Sato32Patrik Vagovič33European XFEL GmbH, Schenefeld, GermanyUniversity of P. J. Šafárik, Kosice, SlovakiaSynchrotron Radiation Research and NanoLund, Lund University, SwedenEuropean XFEL GmbH, Schenefeld, GermanyEuropean XFEL GmbH, Schenefeld, GermanyEuropean XFEL GmbH, Schenefeld, GermanyEuropean XFEL GmbH, Schenefeld, GermanyEuropean XFEL GmbH, Schenefeld, GermanyEuropean XFEL GmbH, Schenefeld, GermanyEuropean XFEL GmbH, Schenefeld, GermanyEuropean XFEL GmbH, Schenefeld, GermanyEuropean XFEL GmbH, Schenefeld, GermanyEuropean XFEL GmbH, Schenefeld, GermanyEuropean XFEL GmbH, Schenefeld, GermanyEuropean XFEL GmbH, Schenefeld, GermanyUniversity of P. J. Šafárik, Kosice, SlovakiaSynchrotron Radiation Research and NanoLund, Lund University, SwedenFaculty of Natural Sciences, Institute for Physics, Otto von Guericke University Magdeburg, Universitätsplatz 2, 39106 Magdeburg, GermanyFaculty of Natural Sciences, Institute for Physics, Otto von Guericke University Magdeburg, Universitätsplatz 2, 39106 Magdeburg, GermanyInstitute of Materials Science and Technology, Technische Universität Berlin, Hardenbergstrasse 36, 10623 Berlin, GermanyInstitute of Materials Science and Technology, Technische Universität Berlin, Hardenbergstrasse 36, 10623 Berlin, GermanyFZU – Institute of Physics, Czech Academy of Sciences, Prague, Czech RepublicFZU – Institute of Physics, Czech Academy of Sciences, Prague, Czech RepublicFZU – Institute of Physics, Czech Academy of Sciences, Prague, Czech RepublicInternational Center for Synchrotron Radiation Innovation Smart (SRIS), Tohoku University, Katahira 2-1-1, Aoba-ku, Sendai, Miyagi 980-8577, JapanDepartment of Finemechanics, Tohoku University, 6-6-01 Aramaki, Aoba-ku, Sendai 980-8579, JapanDepartment of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, United KingdomDepartment of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, United KingdomUniversity of P. J. Šafárik, Kosice, SlovakiaCenter for Free-Electron Laser Science (CFEL), Deutsches Elektronen-Synchrotron (DESY), Notkestrasse 85, 22607 Hamburg, GermanyCenter for Free-Electron Laser Science (CFEL), Deutsches Elektronen-Synchrotron (DESY), Notkestrasse 85, 22607 Hamburg, GermanyEuropean XFEL GmbH, Schenefeld, GermanyEuropean XFEL GmbH, Schenefeld, GermanyEuropean XFEL GmbH, Schenefeld, GermanyWe report on recent developments that enable megahertz hard X-ray phase contrast imaging (MHz XPCI) experiments at the Single Particles, Clusters, and Biomolecules and Serial Femtosecond Crystallography (SPB/SFX) instrument of the European XFEL facility (EuXFEL). We describe the technical implementation of the key components, including an MHz fast camera and a modular indirect X-ray microscope system based on fast scintillators coupled through a high-resolution optical microscope, which enable full-field X-ray microscopy with phase contrast of fast and irreversible phenomena. The image quality for MHz XPCI data showed significant improvement compared with a pilot demonstration of the technique using parallel beam illumination, which also allows access to up to 24 keV photon energies at the SPB/SFX instrument of the EuXFEL. With these developments, MHz XPCI was implemented as a new method offered for a broad user community (academic and industrial) and is accessible via standard user proposals. Furthermore, intra-train pulse diagnostics with a high few-micrometre spatial resolution and recording up to 128 images of consecutive pulses in a train at up to 1.1 MHz repetition rate is available upstream of the instrument. Together with the diagnostic camera upstream of the instrument and the MHz XPCI setup at the SPB/SFX instrument, simultaneous two-plane measurements for future beam studies and feedback for machine parameter tuning are now possible.https://journals.iucr.org/paper?S160057752400986Xmegahertz samplingx-ray phase contrast imagingpulse-resolved imagingindirect mhz x-ray detectoreuropean xfel |
| spellingShingle | Jayanath C. P. Koliyadu Daniel Moško Eleni Myrto Asimakopoulou Valerio Bellucci Šarlota Birnšteinová Richard Bean Romain Letrun Chan Kim Henry Kirkwood Gabriele Giovanetti Nerea Jardon Janusz Szuba Trey Guest Andreas Koch Jan Grünert Peter Szeles Pablo Villanueva-Perez Fabian Reuter Claus-Dieter Ohl Mike Andreas Noack Francisco Garcia-Moreno Zuzana Kuglerová-Valdová Libor Juha Martin Nikl Wataru Yashiro Hitoshi Soyama Daniel Eakins Alexander M. Korsunsky Jozef Uličný Alke Meents Henry N. Chapman Adrian P. Mancuso Tokushi Sato Patrik Vagovič Development of MHz X-ray phase contrast imaging at the European XFEL Journal of Synchrotron Radiation megahertz sampling x-ray phase contrast imaging pulse-resolved imaging indirect mhz x-ray detector european xfel |
| title | Development of MHz X-ray phase contrast imaging at the European XFEL |
| title_full | Development of MHz X-ray phase contrast imaging at the European XFEL |
| title_fullStr | Development of MHz X-ray phase contrast imaging at the European XFEL |
| title_full_unstemmed | Development of MHz X-ray phase contrast imaging at the European XFEL |
| title_short | Development of MHz X-ray phase contrast imaging at the European XFEL |
| title_sort | development of mhz x ray phase contrast imaging at the european xfel |
| topic | megahertz sampling x-ray phase contrast imaging pulse-resolved imaging indirect mhz x-ray detector european xfel |
| url | https://journals.iucr.org/paper?S160057752400986X |
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