Ion Migration and Space‐Charge Zones in Metal Halide Perovskites Through Short‐Circuit Transient Current and Numerical Simulations
Abstract The inherent ion migration in metal halide perovskite materials is known to induce deleterious and highly unstable dark currents in X‐ and γ‐ray detectors based on those compounds upon bias application. Dark current slow drift with time is identified as one of the major drawbacks for these...
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| Format: | Article |
| Language: | English |
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Wiley-VCH
2024-11-01
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| Series: | Advanced Electronic Materials |
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| Online Access: | https://doi.org/10.1002/aelm.202400241 |
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| author | Agustin O. Alvarez Marisé García‐Batlle Ferdinand Lédée Eric Gros‐Daillon Javier Mayén Guillén Jean‐Marie Verilhac Thibault Lemercier Julien Zaccaro Lluis F. Marsal Osbel Almora Germà Garcia‐Belmonte |
| author_facet | Agustin O. Alvarez Marisé García‐Batlle Ferdinand Lédée Eric Gros‐Daillon Javier Mayén Guillén Jean‐Marie Verilhac Thibault Lemercier Julien Zaccaro Lluis F. Marsal Osbel Almora Germà Garcia‐Belmonte |
| author_sort | Agustin O. Alvarez |
| collection | DOAJ |
| description | Abstract The inherent ion migration in metal halide perovskite materials is known to induce deleterious and highly unstable dark currents in X‐ and γ‐ray detectors based on those compounds upon bias application. Dark current slow drift with time is identified as one of the major drawbacks for these devices to satisfy industrial requirements. Because dark current establishes the detectability limit, current evolution, and eventual growth may mask photocurrent signals produced by incoming X‐ray photons. Relevant information for detector assessment is ion‐related parameters such as ion concentration, ion mobility, and ionic space‐charge zones that are eventually built near the outer contacts upon detector biasing. A combined experimental (simple measurement of dark current transients) and 1D numerical simulation method is followed here using single‐crystal and microcrystalline millimeter‐thick methylammonium‐lead bromide that allows extracting ion mobility within the range of µion ≈ 10−7 cm2 V−1 s−1, while ion concentration values approximate Nion ≈ 1015 cm−3, depending on the perovskite crystallinity. |
| format | Article |
| id | doaj-art-483645f6bc1d4839b8dc23c8de26ef8a |
| institution | Kabale University |
| issn | 2199-160X |
| language | English |
| publishDate | 2024-11-01 |
| publisher | Wiley-VCH |
| record_format | Article |
| series | Advanced Electronic Materials |
| spelling | doaj-art-483645f6bc1d4839b8dc23c8de26ef8a2024-11-09T18:01:03ZengWiley-VCHAdvanced Electronic Materials2199-160X2024-11-011011n/an/a10.1002/aelm.202400241Ion Migration and Space‐Charge Zones in Metal Halide Perovskites Through Short‐Circuit Transient Current and Numerical SimulationsAgustin O. Alvarez0Marisé García‐Batlle1Ferdinand Lédée2Eric Gros‐Daillon3Javier Mayén Guillén4Jean‐Marie Verilhac5Thibault Lemercier6Julien Zaccaro7Lluis F. Marsal8Osbel Almora9Germà Garcia‐Belmonte10Institute of Advanced Materials Universitat Jaume I Castelló 12071 SpainInstitute of Advanced Materials Universitat Jaume I Castelló 12071 SpainUniv. Grenoble Alpes CEA Leti F38000 Grenoble FranceUniv. Grenoble Alpes CEA Leti F38000 Grenoble FranceUniv. Grenoble Alpes CEA Leti F38000 Grenoble FranceUniv. Grenoble Alpes CEA Liten F38000 Grenoble FranceUniv. Grenoble Alpes CNRS Grenoble INP Institut Néel Grenoble F38042 FranceUniv. Grenoble Alpes CNRS Grenoble INP Institut Néel Grenoble F38042 FranceDepartment of Electronic Electric and Automatic Engineering Universitat Rovira i Virgili Tarragona 43007 SpainDepartment of Electronic Electric and Automatic Engineering Universitat Rovira i Virgili Tarragona 43007 SpainInstitute of Advanced Materials Universitat Jaume I Castelló 12071 SpainAbstract The inherent ion migration in metal halide perovskite materials is known to induce deleterious and highly unstable dark currents in X‐ and γ‐ray detectors based on those compounds upon bias application. Dark current slow drift with time is identified as one of the major drawbacks for these devices to satisfy industrial requirements. Because dark current establishes the detectability limit, current evolution, and eventual growth may mask photocurrent signals produced by incoming X‐ray photons. Relevant information for detector assessment is ion‐related parameters such as ion concentration, ion mobility, and ionic space‐charge zones that are eventually built near the outer contacts upon detector biasing. A combined experimental (simple measurement of dark current transients) and 1D numerical simulation method is followed here using single‐crystal and microcrystalline millimeter‐thick methylammonium‐lead bromide that allows extracting ion mobility within the range of µion ≈ 10−7 cm2 V−1 s−1, while ion concentration values approximate Nion ≈ 1015 cm−3, depending on the perovskite crystallinity.https://doi.org/10.1002/aelm.202400241charge carrier mobilitydrift‐diffusion simulationsionic conductivitymetal halide perovskitesx‐ray detectors |
| spellingShingle | Agustin O. Alvarez Marisé García‐Batlle Ferdinand Lédée Eric Gros‐Daillon Javier Mayén Guillén Jean‐Marie Verilhac Thibault Lemercier Julien Zaccaro Lluis F. Marsal Osbel Almora Germà Garcia‐Belmonte Ion Migration and Space‐Charge Zones in Metal Halide Perovskites Through Short‐Circuit Transient Current and Numerical Simulations Advanced Electronic Materials charge carrier mobility drift‐diffusion simulations ionic conductivity metal halide perovskites x‐ray detectors |
| title | Ion Migration and Space‐Charge Zones in Metal Halide Perovskites Through Short‐Circuit Transient Current and Numerical Simulations |
| title_full | Ion Migration and Space‐Charge Zones in Metal Halide Perovskites Through Short‐Circuit Transient Current and Numerical Simulations |
| title_fullStr | Ion Migration and Space‐Charge Zones in Metal Halide Perovskites Through Short‐Circuit Transient Current and Numerical Simulations |
| title_full_unstemmed | Ion Migration and Space‐Charge Zones in Metal Halide Perovskites Through Short‐Circuit Transient Current and Numerical Simulations |
| title_short | Ion Migration and Space‐Charge Zones in Metal Halide Perovskites Through Short‐Circuit Transient Current and Numerical Simulations |
| title_sort | ion migration and space charge zones in metal halide perovskites through short circuit transient current and numerical simulations |
| topic | charge carrier mobility drift‐diffusion simulations ionic conductivity metal halide perovskites x‐ray detectors |
| url | https://doi.org/10.1002/aelm.202400241 |
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