Chamfer distance for non-linear registration of Triply Periodic Minimal Surface lattices

Chamfer distance for non-linear registration of Triply Periodic Minimal Surface lattices

We present a 3D image registration technique for non-linear deformation estimation in Additive Manufacturing processes. The methodology involves comparing X-ray Computed Tomography (XCT) data with Computer Aided Design (CAD) models for Triply Periodic Minimal Surface (TPMS) lattices and employs the...

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Bibliographic Details
Main Authors: Michela Lapenna, Francesco Faglioni, Keerthana Chand, Bardia Hejazi, Rita Fioresi, Giovanni Bruno
Format: Article
Language:English
Published: Elsevier 2025-07-01
Series:Additive Manufacturing Letters
Subjects:
Non-linear registration
Additive manufacturing
Computed tomography
Triple periodic minimal surface
Online Access:http://www.sciencedirect.com/science/article/pii/S2772369025000337
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Summary:We present a 3D image registration technique for non-linear deformation estimation in Additive Manufacturing processes. The methodology involves comparing X-ray Computed Tomography (XCT) data with Computer Aided Design (CAD) models for Triply Periodic Minimal Surface (TPMS) lattices and employs the Chamfer distance to refine mesh non-linear deformations.
ISSN:2772-3690

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