Far-Field Antenna Pattern Reconstruction Through Front and Back Planar Near-Field Scanning
This paper introduces a method for obtaining the far-field radiation pattern for all elevation angles through planar near-field measurements of both the front and back sides of an antenna under test (AUT). To obtain near-field measurement data for both the front and back sides of the AUT, sequential...
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Main Authors: | Jeong Yun Han, Dal-Jae Yun, Young Dam Kim |
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Format: | Article |
Language: | English |
Published: |
IEEE
2025-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/10818475/ |
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