Indirect Method of Moisture Degree Evaluation in Varistors by Means of Dielectric Spectroscopy

Varistors, due to their unique properties, are materials commonly used in surge protection devices. Their reliability, however, requires periodic inspection, which should specifically include assessment of their moisture content. So far, no method has been developed that would directly and non-invas...

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Main Author: Krzysztof Walczak
Format: Article
Language:English
Published: MDPI AG 2024-12-01
Series:Energies
Subjects:
Online Access:https://www.mdpi.com/1996-1073/18/1/94
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author Krzysztof Walczak
author_facet Krzysztof Walczak
author_sort Krzysztof Walczak
collection DOAJ
description Varistors, due to their unique properties, are materials commonly used in surge protection devices. Their reliability, however, requires periodic inspection, which should specifically include assessment of their moisture content. So far, no method has been developed that would directly and non-invasively allow for the assessment of the moisture content of a varistor. In this work, an attempt was made to use dielectric spectroscopy for this purpose, i.e., measurements of dielectric parameters in the frequency domain. The tests were carried out on samples of materials based on silicon carbide. The result of the tests was the determination of the dependence of the dielectric response of the tested materials on moisture content, which after further tests may be the starting point for the development of a method for determining the moisture content of varistor surge arresters.
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institution Kabale University
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series Energies
spelling doaj-art-3f557c20ca8046b191ab921db91b71352025-01-10T13:17:04ZengMDPI AGEnergies1996-10732024-12-011819410.3390/en18010094Indirect Method of Moisture Degree Evaluation in Varistors by Means of Dielectric SpectroscopyKrzysztof Walczak0Institute of Electric Power Engineering, Poznan University of Technology, 60-965 Poznan, PolandVaristors, due to their unique properties, are materials commonly used in surge protection devices. Their reliability, however, requires periodic inspection, which should specifically include assessment of their moisture content. So far, no method has been developed that would directly and non-invasively allow for the assessment of the moisture content of a varistor. In this work, an attempt was made to use dielectric spectroscopy for this purpose, i.e., measurements of dielectric parameters in the frequency domain. The tests were carried out on samples of materials based on silicon carbide. The result of the tests was the determination of the dependence of the dielectric response of the tested materials on moisture content, which after further tests may be the starting point for the development of a method for determining the moisture content of varistor surge arresters.https://www.mdpi.com/1996-1073/18/1/94varistorovervoltage protectiondielectric responsediagnosticsmoisture
spellingShingle Krzysztof Walczak
Indirect Method of Moisture Degree Evaluation in Varistors by Means of Dielectric Spectroscopy
Energies
varistor
overvoltage protection
dielectric response
diagnostics
moisture
title Indirect Method of Moisture Degree Evaluation in Varistors by Means of Dielectric Spectroscopy
title_full Indirect Method of Moisture Degree Evaluation in Varistors by Means of Dielectric Spectroscopy
title_fullStr Indirect Method of Moisture Degree Evaluation in Varistors by Means of Dielectric Spectroscopy
title_full_unstemmed Indirect Method of Moisture Degree Evaluation in Varistors by Means of Dielectric Spectroscopy
title_short Indirect Method of Moisture Degree Evaluation in Varistors by Means of Dielectric Spectroscopy
title_sort indirect method of moisture degree evaluation in varistors by means of dielectric spectroscopy
topic varistor
overvoltage protection
dielectric response
diagnostics
moisture
url https://www.mdpi.com/1996-1073/18/1/94
work_keys_str_mv AT krzysztofwalczak indirectmethodofmoisturedegreeevaluationinvaristorsbymeansofdielectricspectroscopy