Mou, B., Liu, Q., Chen, Z., Wu, X., Li, Y., Huang, C., & Zhang, H. A Transient Conducted EM Disturbances Source Modeling Method for Electromagnetic Launch System Based on the Cascaded Multi-Port Circuit Model. IEEE.
Chicago Style (17th ed.) CitationMou, Bailin, Qi-Feng Liu, Zhenya Chen, Xiaowen Wu, Yongming Li, Chen Huang, and Huai-Qing Zhang. A Transient Conducted EM Disturbances Source Modeling Method for Electromagnetic Launch System Based on the Cascaded Multi-Port Circuit Model. IEEE.
MLA (9th ed.) CitationMou, Bailin, et al. A Transient Conducted EM Disturbances Source Modeling Method for Electromagnetic Launch System Based on the Cascaded Multi-Port Circuit Model. IEEE.
Warning: These citations may not always be 100% accurate.