Soft X-ray photoelectron spectroscopy under real ambient pressure conditions

We have developed a measurement system for soft X-ray ambient pressure photoelectron spectroscopy at BL08U of NanoTerasu. An excitation light of 800 eV was introduced by a vacuum tube terminated with a SiN window. Photoelectrons were detected through a ϕ24 μ m aperture at the electron lens entrance...

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Bibliographic Details
Main Authors: Tetsuya Wada, Masafumi Horio, Yifu Liu, Yu Murano, Haruto Sakurai, Toshihide Sumi, Masashige Miyamoto, Susumu Yamamoto, Iwao Matsuda
Format: Article
Language:English
Published: IOP Publishing 2025-01-01
Series:Applied Physics Express
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Online Access:https://doi.org/10.35848/1882-0786/adbda8
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Summary:We have developed a measurement system for soft X-ray ambient pressure photoelectron spectroscopy at BL08U of NanoTerasu. An excitation light of 800 eV was introduced by a vacuum tube terminated with a SiN window. Photoelectrons were detected through a ϕ24 μ m aperture at the electron lens entrance of a differentially pumped analyzer. The Au 4 f core-level spectra of a Au film were measured up to atmospheric pressure (1 bar) with He, to 1 bar with H _2 , and to 0.4 bar with N _2 . The system extends applications of operando experiments for the real functional materials.
ISSN:1882-0786