Experimental and Numerical Analysis of the Potential Drop Method for Defects Caused by Dynamic Loads
The potential drop method (PDM) is employed for defect detection in conductive specimens by measuring the change in impedance. Due to its ability to comprehensively monitor large structures entirely and its high sensitivity to material changes, PDM is a promising method for structural health monitor...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
American Association for the Advancement of Science (AAAS)
2025-01-01
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| Series: | Advanced Devices & Instrumentation |
| Online Access: | https://spj.science.org/doi/10.34133/adi.0074 |
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