Microwave NDT/NDE Through Differential Bayesian Compressive Sensing
This article deals with the nondestructive testing and evaluation (NDT/NDE) of dielectric structures through a sparseness-promoting probabilistic microwave imaging (MI) method. Prior information on both the unperturbed scenario and the class of imaged targets is profitably exploited to formulate the...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2024-01-01
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| Series: | IEEE Open Journal of Instrumentation and Measurement |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10552809/ |
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