Microwave NDT/NDE Through Differential Bayesian Compressive Sensing
This article deals with the nondestructive testing and evaluation (NDT/NDE) of dielectric structures through a sparseness-promoting probabilistic microwave imaging (MI) method. Prior information on both the unperturbed scenario and the class of imaged targets is profitably exploited to formulate the...
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| Format: | Article |
| Language: | English |
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IEEE
2024-01-01
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| Series: | IEEE Open Journal of Instrumentation and Measurement |
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| Online Access: | https://ieeexplore.ieee.org/document/10552809/ |
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| _version_ | 1841536166060359680 |
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| author | Marco Salucci Lorenzo Poli Giorgio Gottardi Giacomo Oliveri Luca Tosi Andrea Massa |
| author_facet | Marco Salucci Lorenzo Poli Giorgio Gottardi Giacomo Oliveri Luca Tosi Andrea Massa |
| author_sort | Marco Salucci |
| collection | DOAJ |
| description | This article deals with the nondestructive testing and evaluation (NDT/NDE) of dielectric structures through a sparseness-promoting probabilistic microwave imaging (MI) method. Prior information on both the unperturbed scenario and the class of imaged targets is profitably exploited to formulate the inverse scattering problem (ISP) at hand within a differential contrast source inversion (CSI) framework. The imaging process is then efficiently completed by applying a customized Bayesian compressive sensing (BCS) inversion strategy. Selected numerical and experimental results are provided to assess the effectiveness of the proposed imaging method also in comparison with competitive state-of-the-art alternatives. |
| format | Article |
| id | doaj-art-39f451093e7c4cc2bb8cf102b3db3325 |
| institution | Kabale University |
| issn | 2768-7236 |
| language | English |
| publishDate | 2024-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Open Journal of Instrumentation and Measurement |
| spelling | doaj-art-39f451093e7c4cc2bb8cf102b3db33252025-01-15T00:04:15ZengIEEEIEEE Open Journal of Instrumentation and Measurement2768-72362024-01-01311510.1109/OJIM.2024.341220510552809Microwave NDT/NDE Through Differential Bayesian Compressive SensingMarco Salucci0https://orcid.org/0000-0002-6948-8636Lorenzo Poli1https://orcid.org/0000-0002-8816-1970Giorgio Gottardi2https://orcid.org/0000-0003-2308-4983Giacomo Oliveri3https://orcid.org/0000-0002-5238-358XLuca Tosi4https://orcid.org/0000-0003-2089-2483Andrea Massa5https://orcid.org/0000-0002-8429-8937DICAM - Department of Civil, Environmental, and Mechanical Engineering, ELEDIA Research Center (ELEDIA@UniTN - University of Trento), Trento, ItalyDICAM - Department of Civil, Environmental, and Mechanical Engineering, ELEDIA Research Center (ELEDIA@UniTN - University of Trento), Trento, ItalyDICAM - Department of Civil, Environmental, and Mechanical Engineering, ELEDIA Research Center (ELEDIA@UniTN - University of Trento), Trento, ItalyDICAM - Department of Civil, Environmental, and Mechanical Engineering, ELEDIA Research Center (ELEDIA@UniTN - University of Trento), Trento, ItalyDICAM - Department of Civil, Environmental, and Mechanical Engineering, ELEDIA Research Center (ELEDIA@UniTN - University of Trento), Trento, ItalyDICAM - Department of Civil, Environmental, and Mechanical Engineering, ELEDIA Research Center (ELEDIA@UniTN - University of Trento), Trento, ItalyThis article deals with the nondestructive testing and evaluation (NDT/NDE) of dielectric structures through a sparseness-promoting probabilistic microwave imaging (MI) method. Prior information on both the unperturbed scenario and the class of imaged targets is profitably exploited to formulate the inverse scattering problem (ISP) at hand within a differential contrast source inversion (CSI) framework. The imaging process is then efficiently completed by applying a customized Bayesian compressive sensing (BCS) inversion strategy. Selected numerical and experimental results are provided to assess the effectiveness of the proposed imaging method also in comparison with competitive state-of-the-art alternatives.https://ieeexplore.ieee.org/document/10552809/Bayesian compressive sensing (BCS)differential imaginginverse scattering problem (ISP)microwave imaging (MI)nondestructive testing and evaluation (NDT/NDE) |
| spellingShingle | Marco Salucci Lorenzo Poli Giorgio Gottardi Giacomo Oliveri Luca Tosi Andrea Massa Microwave NDT/NDE Through Differential Bayesian Compressive Sensing IEEE Open Journal of Instrumentation and Measurement Bayesian compressive sensing (BCS) differential imaging inverse scattering problem (ISP) microwave imaging (MI) nondestructive testing and evaluation (NDT/NDE) |
| title | Microwave NDT/NDE Through Differential Bayesian Compressive Sensing |
| title_full | Microwave NDT/NDE Through Differential Bayesian Compressive Sensing |
| title_fullStr | Microwave NDT/NDE Through Differential Bayesian Compressive Sensing |
| title_full_unstemmed | Microwave NDT/NDE Through Differential Bayesian Compressive Sensing |
| title_short | Microwave NDT/NDE Through Differential Bayesian Compressive Sensing |
| title_sort | microwave ndt nde through differential bayesian compressive sensing |
| topic | Bayesian compressive sensing (BCS) differential imaging inverse scattering problem (ISP) microwave imaging (MI) nondestructive testing and evaluation (NDT/NDE) |
| url | https://ieeexplore.ieee.org/document/10552809/ |
| work_keys_str_mv | AT marcosalucci microwavendtndethroughdifferentialbayesiancompressivesensing AT lorenzopoli microwavendtndethroughdifferentialbayesiancompressivesensing AT giorgiogottardi microwavendtndethroughdifferentialbayesiancompressivesensing AT giacomooliveri microwavendtndethroughdifferentialbayesiancompressivesensing AT lucatosi microwavendtndethroughdifferentialbayesiancompressivesensing AT andreamassa microwavendtndethroughdifferentialbayesiancompressivesensing |