Kim, H., Kim, S., Park, C., & Kim, K. Similarity Evaluation of Patent Drawings using ResNet and SIFT. Korea Institute of Intellectual Property.
Chicago Style (17th ed.) CitationKim, Hyuna, Seongju Kim, Cheonho Park, and Kyungsoon Kim. Similarity Evaluation of Patent Drawings Using ResNet and SIFT. Korea Institute of Intellectual Property.
MLA (9th ed.) CitationKim, Hyuna, et al. Similarity Evaluation of Patent Drawings Using ResNet and SIFT. Korea Institute of Intellectual Property.
Warning: These citations may not always be 100% accurate.