Imaging performance of a CaWO4/CMOS sensor
The aim of this study was to investigate the modulation transfer function (MTF) and the effective gain transfer function (eGTF) of a non-destruc¬¬tive testing (NDT)/industrial inspection complementary metal oxide semi¬conductor (CMOS) sensor in conjunction with a thin calcium tungstate (CaWO4) scree...
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| Format: | Article |
| Language: | English |
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Gruppo Italiano Frattura
2019-10-01
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| Series: | Fracture and Structural Integrity |
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| Online Access: | https://www.fracturae.com/index.php/fis/article/view/2614/2755 |
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| author | Niki Martini Vaia Koukou George Fountos Ioannis Valais Ioannis Kandarakis Christos Michail Athanasios Bakas Eleftherios Lavdas Konstantinos Ninos Georgia Oikonomou Lida Gogou George Panayiotakis |
| author_facet | Niki Martini Vaia Koukou George Fountos Ioannis Valais Ioannis Kandarakis Christos Michail Athanasios Bakas Eleftherios Lavdas Konstantinos Ninos Georgia Oikonomou Lida Gogou George Panayiotakis |
| author_sort | Niki Martini |
| collection | DOAJ |
| description | The aim of this study was to investigate the modulation transfer function (MTF) and the effective gain transfer function (eGTF) of a non-destruc¬¬tive testing (NDT)/industrial inspection complementary metal oxide semi¬conductor (CMOS) sensor in conjunction with a thin calcium tungstate (CaWO4) screen. Thin screen samples, with dimensions of 2.7x3.6 cm2 and thick¬ness of 118.9 �m, estimated from scanning electron microscopy-SEM im¬ages, were extracted from an Agfa Curix universal screen and coupled to the active area of an active pixel (APS) CMOS sensor. MTF was assessed using the slanted-edge method, following the IEC 62220-1-1:2015 method. MTF values were found high across the examined spatial frequency range. eGTF was found maximum when CaWO4 was combined with charge-coupled devices (CCD) of broadband anti-reflection (AR) coating (17.52 at 0 cycles/mm). The com¬bi¬nation of the thin CaWO4 screen with the CMOS sensor provided very pro¬mis¬ing image resolution and adequate efficiency properties, thus could be also con¬sidered for use in CMOS based X-ray imaging devices, for various applications |
| format | Article |
| id | doaj-art-392bb20ff84c4dd280783bfb317a613b |
| institution | Kabale University |
| issn | 1971-8993 |
| language | English |
| publishDate | 2019-10-01 |
| publisher | Gruppo Italiano Frattura |
| record_format | Article |
| series | Fracture and Structural Integrity |
| spelling | doaj-art-392bb20ff84c4dd280783bfb317a613b2025-01-03T01:02:44ZengGruppo Italiano FratturaFracture and Structural Integrity1971-89932019-10-01135047148010.3221/IGF-ESIS.50.3910.3221/IGF-ESIS.50.39Imaging performance of a CaWO4/CMOS sensorNiki MartiniVaia KoukouGeorge FountosIoannis ValaisIoannis KandarakisChristos MichailAthanasios BakasEleftherios LavdasKonstantinos NinosGeorgia OikonomouLida GogouGeorge PanayiotakisThe aim of this study was to investigate the modulation transfer function (MTF) and the effective gain transfer function (eGTF) of a non-destruc¬¬tive testing (NDT)/industrial inspection complementary metal oxide semi¬conductor (CMOS) sensor in conjunction with a thin calcium tungstate (CaWO4) screen. Thin screen samples, with dimensions of 2.7x3.6 cm2 and thick¬ness of 118.9 �m, estimated from scanning electron microscopy-SEM im¬ages, were extracted from an Agfa Curix universal screen and coupled to the active area of an active pixel (APS) CMOS sensor. MTF was assessed using the slanted-edge method, following the IEC 62220-1-1:2015 method. MTF values were found high across the examined spatial frequency range. eGTF was found maximum when CaWO4 was combined with charge-coupled devices (CCD) of broadband anti-reflection (AR) coating (17.52 at 0 cycles/mm). The com¬bi¬nation of the thin CaWO4 screen with the CMOS sensor provided very pro¬mis¬ing image resolution and adequate efficiency properties, thus could be also con¬sidered for use in CMOS based X-ray imaging devices, for various applicationshttps://www.fracturae.com/index.php/fis/article/view/2614/2755cawo4phosphorsmedical imagingapscmos sensorsmtf |
| spellingShingle | Niki Martini Vaia Koukou George Fountos Ioannis Valais Ioannis Kandarakis Christos Michail Athanasios Bakas Eleftherios Lavdas Konstantinos Ninos Georgia Oikonomou Lida Gogou George Panayiotakis Imaging performance of a CaWO4/CMOS sensor Fracture and Structural Integrity cawo4 phosphors medical imaging aps cmos sensors mtf |
| title | Imaging performance of a CaWO4/CMOS sensor |
| title_full | Imaging performance of a CaWO4/CMOS sensor |
| title_fullStr | Imaging performance of a CaWO4/CMOS sensor |
| title_full_unstemmed | Imaging performance of a CaWO4/CMOS sensor |
| title_short | Imaging performance of a CaWO4/CMOS sensor |
| title_sort | imaging performance of a cawo4 cmos sensor |
| topic | cawo4 phosphors medical imaging aps cmos sensors mtf |
| url | https://www.fracturae.com/index.php/fis/article/view/2614/2755 |
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