Simple Modeling of the Ratio of Fields at a Tip and a Contacting Surface with External Illumination

The analysis of the relation of fields generated at a tip and a contacting surface is performed in the Rayleigh approximation of a simple dipole model for the standard configuration of tip-enhanced Raman scattering experiments with external excitation. A comparison of the present results with the pr...

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Bibliographic Details
Main Author: E. Bortchagovsky
Format: Article
Language:English
Published: Wiley 2018-01-01
Series:Journal of Nanotechnology
Online Access:http://dx.doi.org/10.1155/2018/3898524
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Summary:The analysis of the relation of fields generated at a tip and a contacting surface is performed in the Rayleigh approximation of a simple dipole model for the standard configuration of tip-enhanced Raman scattering experiments with external excitation. A comparison of the present results with the previous ones obtained for the case of tip-source reveals the role of tip-surface configuration as the amplifier of the exciting field and the stronger influence of roughness on the field distribution at external illumination, as roughness is directly excited by the external field producing second source of field in addition to the tip.
ISSN:1687-9503
1687-9511