Simulation of Proton Beam Effects in Thin Insulating Films
Effects of exposing several insulators, commonly used for various purposes in integrated circuits, to beams of protons have been investigated. Materials considered include silicon dioxide, silicon nitride, aluminium nitride, alumina, and polycarbonate (Lexan). The passage of proton beams through ult...
Saved in:
Main Authors: | Ljubinko Timotijevic, Irfan Fetahovic, Djordje Lazarevic, Milos Vujisic |
---|---|
Format: | Article |
Language: | English |
Published: |
Wiley
2013-01-01
|
Series: | International Journal of Photoenergy |
Online Access: | http://dx.doi.org/10.1155/2013/128410 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Influence of Proton Irradiation on Thin Films of AZO and ITO Transparent Conductive Oxides—Simulation of Space Environment
by: Katarzyna Ungeheuer, et al.
Published: (2025-01-01) -
Comparison of Arc Erosive and Laser Beam Trimming of Thin Film Resistors
by: Zs. Illyefalvi-Vitéz
Published: (1977-01-01) -
Changes in scanning orientation effects of Gafchromic EBT-3 film irradiated with ultra-high dose rate proton beams
by: Hiroshi Yasuda, et al.
Published: (2025-01-01) -
Enhanced high-energy proton radiation hardness of ZnO thin-film transistors with a passivation layer
by: Yongsu Lee, et al.
Published: (2025-01-01) -
Thin Film Transistors and Thin Film Transistor Circuits
by: Andre Van Calster
Published: (1983-01-01)