A Detailed Analytical Study of Non-Linear Semiconductor Device Modelling
This paper presents a detailed analytical study of Gunn, SCR, and p-n junction and of the physical processes that occur inside. Based on the properties of these devices, models for Gunn, SCR, and p-n junction diode have been developed. The results of computer simulated examples have been presented i...
Saved in:
Main Author: | Umesh Kumar |
---|---|
Format: | Article |
Language: | English |
Published: |
Wiley
1995-01-01
|
Series: | Active and Passive Electronic Components |
Online Access: | http://dx.doi.org/10.1155/1995/59312 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Detailed Theoretical Model for Adjustable Gain-Clamped Semiconductor Optical Amplifier
by: Lin Liu, et al.
Published: (2012-01-01) -
Devices for express diagnostics of power semiconductor devices and semiconductor converters
by: E. B. Koroleva, et al.
Published: (2023-06-01) -
Detailed Spectroscopic and Structural Analysis of TiO2/WO3 Composite Semiconductors
by: Biborka Boga, et al.
Published: (2018-01-01) -
Metal/Semiconductor and Transparent Conductor/Semiconductor Heterojunctions in High Efficient Photoelectric Devices: Progress and Features
by: M. Melvin David Kumar, et al.
Published: (2014-01-01) -
Effects of Non-Idealities of OP-AMPs on Active Filters: An Analytical Study
by: Prem Bhushan Mital, et al.
Published: (1994-01-01)