A Detailed Analytical Study of Non-Linear Semiconductor Device Modelling

This paper presents a detailed analytical study of Gunn, SCR, and p-n junction and of the physical processes that occur inside. Based on the properties of these devices, models for Gunn, SCR, and p-n junction diode have been developed. The results of computer simulated examples have been presented i...

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Main Author: Umesh Kumar
Format: Article
Language:English
Published: Wiley 1995-01-01
Series:Active and Passive Electronic Components
Online Access:http://dx.doi.org/10.1155/1995/59312
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author Umesh Kumar
author_facet Umesh Kumar
author_sort Umesh Kumar
collection DOAJ
description This paper presents a detailed analytical study of Gunn, SCR, and p-n junction and of the physical processes that occur inside. Based on the properties of these devices, models for Gunn, SCR, and p-n junction diode have been developed. The results of computer simulated examples have been presented in each case. The non-linear lumped model for Gunn is a unified model as it describes the diffusion effects as the-domain traves from cathode to anode. An additional feature of this model is that it describes the domain extinction and nucleation phenomena in Gunn dioder with the help of a simple timing circuit. The non-linear lumped model for SCR is general and is valid under any mode of operation in any circuit environment. The memristive circuit model for p-n junction diodes is capable of simulating realistically the diode’s dynamic behavior under reverse, forward and sinusiodal operating modes. The model uses memristor, the charge-controlled resistor to mimic various second-order effects due to conductivity modulation. It is found that both storage time and fall time of the diode can be accurately predicted.
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publishDate 1995-01-01
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spelling doaj-art-2fc64a2bfb1e46ffa3445ee88372d6032025-02-03T05:47:33ZengWileyActive and Passive Electronic Components0882-75161563-50311995-01-0118421124510.1155/1995/59312A Detailed Analytical Study of Non-Linear Semiconductor Device ModellingUmesh Kumar0Department of Electrical Engineering, I.I. T., Havz KHAS, New Delhi 110016, IndiaThis paper presents a detailed analytical study of Gunn, SCR, and p-n junction and of the physical processes that occur inside. Based on the properties of these devices, models for Gunn, SCR, and p-n junction diode have been developed. The results of computer simulated examples have been presented in each case. The non-linear lumped model for Gunn is a unified model as it describes the diffusion effects as the-domain traves from cathode to anode. An additional feature of this model is that it describes the domain extinction and nucleation phenomena in Gunn dioder with the help of a simple timing circuit. The non-linear lumped model for SCR is general and is valid under any mode of operation in any circuit environment. The memristive circuit model for p-n junction diodes is capable of simulating realistically the diode’s dynamic behavior under reverse, forward and sinusiodal operating modes. The model uses memristor, the charge-controlled resistor to mimic various second-order effects due to conductivity modulation. It is found that both storage time and fall time of the diode can be accurately predicted.http://dx.doi.org/10.1155/1995/59312
spellingShingle Umesh Kumar
A Detailed Analytical Study of Non-Linear Semiconductor Device Modelling
Active and Passive Electronic Components
title A Detailed Analytical Study of Non-Linear Semiconductor Device Modelling
title_full A Detailed Analytical Study of Non-Linear Semiconductor Device Modelling
title_fullStr A Detailed Analytical Study of Non-Linear Semiconductor Device Modelling
title_full_unstemmed A Detailed Analytical Study of Non-Linear Semiconductor Device Modelling
title_short A Detailed Analytical Study of Non-Linear Semiconductor Device Modelling
title_sort detailed analytical study of non linear semiconductor device modelling
url http://dx.doi.org/10.1155/1995/59312
work_keys_str_mv AT umeshkumar adetailedanalyticalstudyofnonlinearsemiconductordevicemodelling
AT umeshkumar detailedanalyticalstudyofnonlinearsemiconductordevicemodelling