A novel self-biased pMOS clamped deep trench CSTBT with enhanced tradeoff and short-circuit capability

Abstract In this work, a novel deep trench CSTBT (DT-CSTBT) features emitter trench and the P-layer is proposed and investigated by simulation. The self-biased pMOS, comprising an emitter trench, N-CS layer, P-layer, and P-well, demonstrates an excellent clamping effect potential. The proposed DT-CS...

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Main Authors: Jianbin Guo, Zhehong Qian, Xinru Chen, Hang Xu, Yafen Yang, David Wei Zhang
Format: Article
Language:English
Published: Nature Portfolio 2025-01-01
Series:Scientific Reports
Subjects:
Online Access:https://doi.org/10.1038/s41598-025-85530-0
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author Jianbin Guo
Zhehong Qian
Xinru Chen
Hang Xu
Yafen Yang
David Wei Zhang
author_facet Jianbin Guo
Zhehong Qian
Xinru Chen
Hang Xu
Yafen Yang
David Wei Zhang
author_sort Jianbin Guo
collection DOAJ
description Abstract In this work, a novel deep trench CSTBT (DT-CSTBT) features emitter trench and the P-layer is proposed and investigated by simulation. The self-biased pMOS, comprising an emitter trench, N-CS layer, P-layer, and P-well, demonstrates an excellent clamping effect potential. The proposed DT-CSTBT suppresses the saturation current and improves the heat dissipation, resulting in a 23.5% expansion of the short-circuit safe operating area (SCSOA). It ensures the better reliability of the gate due to the high electric field away from the gate. Furthermore, the tradeoff relationship between on-state voltage (V ON) and turn-off loss (E off) of the new structure is also improved by 23.2% compared with the conventional CSTBT.
format Article
id doaj-art-2ae716c69c9c4e02b3031b51de8f004a
institution Kabale University
issn 2045-2322
language English
publishDate 2025-01-01
publisher Nature Portfolio
record_format Article
series Scientific Reports
spelling doaj-art-2ae716c69c9c4e02b3031b51de8f004a2025-01-12T12:23:24ZengNature PortfolioScientific Reports2045-23222025-01-0115111910.1038/s41598-025-85530-0A novel self-biased pMOS clamped deep trench CSTBT with enhanced tradeoff and short-circuit capabilityJianbin Guo0Zhehong Qian1Xinru Chen2Hang Xu3Yafen Yang4David Wei Zhang5School of Microelectronics, Fudan UniversitySchool of Microelectronics, Fudan UniversitySchool of Microelectronics, Fudan UniversitySchool of Microelectronics, Fudan UniversitySchool of Microelectronics, Fudan UniversitySchool of Microelectronics, Fudan UniversityAbstract In this work, a novel deep trench CSTBT (DT-CSTBT) features emitter trench and the P-layer is proposed and investigated by simulation. The self-biased pMOS, comprising an emitter trench, N-CS layer, P-layer, and P-well, demonstrates an excellent clamping effect potential. The proposed DT-CSTBT suppresses the saturation current and improves the heat dissipation, resulting in a 23.5% expansion of the short-circuit safe operating area (SCSOA). It ensures the better reliability of the gate due to the high electric field away from the gate. Furthermore, the tradeoff relationship between on-state voltage (V ON) and turn-off loss (E off) of the new structure is also improved by 23.2% compared with the conventional CSTBT.https://doi.org/10.1038/s41598-025-85530-0CSTBTSelf-biased pMOSSaturation currentTurn-off lossShort-circuit safe operating area
spellingShingle Jianbin Guo
Zhehong Qian
Xinru Chen
Hang Xu
Yafen Yang
David Wei Zhang
A novel self-biased pMOS clamped deep trench CSTBT with enhanced tradeoff and short-circuit capability
Scientific Reports
CSTBT
Self-biased pMOS
Saturation current
Turn-off loss
Short-circuit safe operating area
title A novel self-biased pMOS clamped deep trench CSTBT with enhanced tradeoff and short-circuit capability
title_full A novel self-biased pMOS clamped deep trench CSTBT with enhanced tradeoff and short-circuit capability
title_fullStr A novel self-biased pMOS clamped deep trench CSTBT with enhanced tradeoff and short-circuit capability
title_full_unstemmed A novel self-biased pMOS clamped deep trench CSTBT with enhanced tradeoff and short-circuit capability
title_short A novel self-biased pMOS clamped deep trench CSTBT with enhanced tradeoff and short-circuit capability
title_sort novel self biased pmos clamped deep trench cstbt with enhanced tradeoff and short circuit capability
topic CSTBT
Self-biased pMOS
Saturation current
Turn-off loss
Short-circuit safe operating area
url https://doi.org/10.1038/s41598-025-85530-0
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