A model to quantify fatigue crack growth by cyclic damage accumulation calculated by strip-yield procedures

A model to quantify fatigue crack growth by cyclic damage accumulation calculated by strip-yield procedures

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Elber's hypothesis that  Keff can be assumed as the driving force for fatigue crack growth (FCG) is the basis for strip-yield models widely used to predict fatigue lives under variable amplitude loads, although it does not explain all load sequence effects observed in practice. To verify if th...

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Bibliographic Details
Main Authors: Samuel Elias Ferreira, Jaime Tupiassú Pinho de Castro, Marco Antonio Meggiolaro
Format: Article
Language:English
Published: Gruppo Italiano Frattura 2017-07-01
Series:Fracture and Structural Integrity
Subjects:
Fatigue crack growth models
Strip-yield mechanics
Crack closure
; Damage accumulation ahead of the crack tip
Online Access:http://www.gruppofrattura.it/pdf/rivista/numero41/numero_41_art_18.pdf
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