A SEM-X-Ray assisted experimental approach for the determination of mechanical and thermal load � induced damage in MMCs
An experimental technique is presented to evaluate mechanical and thermal load-induced microstructural damage, based on the Electron Probe Micro-Analysis (EPMA) principle, by which certain ana¬lyti¬cal potentialities of Scanning Electron Micro¬scopy (SEM) are used. The aim of the study is to apply t...
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Main Authors: | Victor N. Kytopoulos, Emilios Sideridis, John Venetis, Chrysoula Riga, Alexandros Altzoumailis |
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Format: | Article |
Language: | English |
Published: |
Gruppo Italiano Frattura
2019-10-01
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Series: | Fracture and Structural Integrity |
Subjects: | |
Online Access: | https://www.fracturae.com/index.php/fis/article/view/2610/2747 |
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