Hajek, K., & Kohl, Z. Multiple Aliasing of Windowed Real-Valued Signal as a Cause of Accuracy Limitation of DFT Methods. IEEE.
Chicago Style (17th ed.) CitationHajek, Karel, and Zdenek Kohl. Multiple Aliasing of Windowed Real-Valued Signal as a Cause of Accuracy Limitation of DFT Methods. IEEE.
MLA (9th ed.) CitationHajek, Karel, and Zdenek Kohl. Multiple Aliasing of Windowed Real-Valued Signal as a Cause of Accuracy Limitation of DFT Methods. IEEE.
Warning: These citations may not always be 100% accurate.