Research by Fondazione Bruno Kessler on Strategies to Improve the Yield in Plasma Focused Ion Beam Circuit Editing

Research by Fondazione Bruno Kessler on Strategies to Improve the Yield in Plasma Focused Ion Beam Circuit Editing

This contribution explores the potential of PFIB for the post-production circuit editing of custom ASICs. The reworking of integrated circuits with ion beam is an effective tool for testing design modifications rapidly, and in small-volume productions, it proves to be a valuable substitute for the m...

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Bibliographic Details
Main Authors: David Novel, Evgeny Demenev, Lorenza Ferrario
Format: Article
Language:English
Published: MDPI AG 2024-03-01
Series:Proceedings
Subjects:
PFIB
ASICs
circuit edit
design modifications
silicon
electrical testing
Online Access:https://www.mdpi.com/2504-3900/97/1/59
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