APA (7th ed.) Citation

Son, K. Y., Shin, D. W., Lee, J. E., Kim, S. H., Yun, J. M., & Cho, B. Correction: Association between timed up and go test and future incidence of disability: A nationwide representative longitudinal study in Korea. Public Library of Science (PLoS).

Chicago Style (17th ed.) Citation

Son, Ki Young, Dong Wook Shin, Ji Eun Lee, Sang Hyuck Kim, Jae Moon Yun, and Belong Cho. Correction: Association Between Timed Up and Go Test and Future Incidence of Disability: A Nationwide Representative Longitudinal Study in Korea. Public Library of Science (PLoS).

MLA (9th ed.) Citation

Son, Ki Young, et al. Correction: Association Between Timed Up and Go Test and Future Incidence of Disability: A Nationwide Representative Longitudinal Study in Korea. Public Library of Science (PLoS).