Morphological, Structural, and Optical Bandgap Characterization of Extracted ZnO Nanoparticles from Commercial Paste

ZnO nanoparticles (NPs) were extracted from a commercial paste in both colloidal and precipitate forms. The Zetasizer analysis performed on the colloid showed ZnO NPs ranging from ∼30 nm to ∼100 nm. Thin films of ZnO were deposited on glass substrates by spin-coating technique from a mixture of the...

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Bibliographic Details
Main Authors: Mahmoud Nabil, I. V. Perez-Quintana, M. Acosta, J. A. Mendez-Gamboa, R. Castro-Rodriguez
Format: Article
Language:English
Published: Wiley 2021-01-01
Series:Advances in Materials Science and Engineering
Online Access:http://dx.doi.org/10.1155/2021/9926544
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Summary:ZnO nanoparticles (NPs) were extracted from a commercial paste in both colloidal and precipitate forms. The Zetasizer analysis performed on the colloid showed ZnO NPs ranging from ∼30 nm to ∼100 nm. Thin films of ZnO were deposited on glass substrates by spin-coating technique from a mixture of the extracted colloid and precipitate. The scanning electron microscope (SEM) images showed uniformly arranged, mesoporous, and nanostructured ZnO particles of different shapes, with an estimated film thickness of 0.67 μm. Analysis by energy dispersive X-ray spectroscopy (EDS) and X-ray diffraction analysis (XRD) confirmed the presence of ZnO in the films, with no impurities or remnants of other materials. The XRD analysis showed a polycrystalline nature of the films and identified a pure phase formation of the hexagonal wurtzite structure. The average crystallite size calculated from the diffraction peaks is ∼43.25 nm. The calculated crystal tensile strain is 1.954 × 10−3, which increases the crystal volume by 0.728% compared with the crystal volume of standard ZnO. The calculated crystal parameters are a = b = 3.258 Å and c = 5.217 Å. The calculated dislocation density (d) and bond length Zn–O (L) are 5.35 × 10−4 nm−2 and 2.695 Å, respectively. Ultraviolet-visible absorption spectra showed an optical band gap of ∼3.80 eV.
ISSN:1687-8434
1687-8442