Measurement and control of magnetic thin films and devices using thermal gradients applied via suspended Si-N membranes
Magnetic thin films and nanostructures present a unique challenge for a range of thermal measurements, with important consequences for both fundamental physics and material science and applications. This paper reviews the unique capabilities for measurement and control of these systems using thermal...
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| Format: | Article |
| Language: | English |
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Taylor & Francis Group
2025-12-01
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| Series: | Science and Technology of Advanced Materials |
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| Online Access: | https://www.tandfonline.com/doi/10.1080/14686996.2025.2531735 |
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| author | B. L. Zink |
| author_facet | B. L. Zink |
| author_sort | B. L. Zink |
| collection | DOAJ |
| description | Magnetic thin films and nanostructures present a unique challenge for a range of thermal measurements, with important consequences for both fundamental physics and material science and applications. This paper reviews the unique capabilities for measurement and control of these systems using thermal gradients applied using micro- and nanofabricated silicon-nitride membrane platforms. Supporting a thin film or nanostructure removes bulk heat sinks from the tiny structure, enabling otherwise challenging or impossible measurements including thermal conductivity, Seebeck coefficient, Peltier coefficient, magnon drag, both the anomalous and planar Nernst effect, specific heat, and novel manifestations of thermally assisted spin transport. After providing some historical context and motivation and overviewing the design and fabrication of silicon-nitride membrane thermal platforms, example data for each of the measurements above is reviewed, and the paper concludes with a consideration of the outlook for measurements enabled by these techniques. |
| format | Article |
| id | doaj-art-1a5e637c52c34743b3a3b44f38dea8a0 |
| institution | Kabale University |
| issn | 1468-6996 1878-5514 |
| language | English |
| publishDate | 2025-12-01 |
| publisher | Taylor & Francis Group |
| record_format | Article |
| series | Science and Technology of Advanced Materials |
| spelling | doaj-art-1a5e637c52c34743b3a3b44f38dea8a02025-08-20T03:44:05ZengTaylor & Francis GroupScience and Technology of Advanced Materials1468-69961878-55142025-12-0126110.1080/14686996.2025.2531735Measurement and control of magnetic thin films and devices using thermal gradients applied via suspended Si-N membranesB. L. Zink0Department of Physics and Astronomy, University of Denver, Denver, CO, USAMagnetic thin films and nanostructures present a unique challenge for a range of thermal measurements, with important consequences for both fundamental physics and material science and applications. This paper reviews the unique capabilities for measurement and control of these systems using thermal gradients applied using micro- and nanofabricated silicon-nitride membrane platforms. Supporting a thin film or nanostructure removes bulk heat sinks from the tiny structure, enabling otherwise challenging or impossible measurements including thermal conductivity, Seebeck coefficient, Peltier coefficient, magnon drag, both the anomalous and planar Nernst effect, specific heat, and novel manifestations of thermally assisted spin transport. After providing some historical context and motivation and overviewing the design and fabrication of silicon-nitride membrane thermal platforms, example data for each of the measurements above is reviewed, and the paper concludes with a consideration of the outlook for measurements enabled by these techniques.https://www.tandfonline.com/doi/10.1080/14686996.2025.2531735Seebeck Coefficient; thermal conductivitythin filmsspin transport |
| spellingShingle | B. L. Zink Measurement and control of magnetic thin films and devices using thermal gradients applied via suspended Si-N membranes Science and Technology of Advanced Materials Seebeck Coefficient; thermal conductivity thin films spin transport |
| title | Measurement and control of magnetic thin films and devices using thermal gradients applied via suspended Si-N membranes |
| title_full | Measurement and control of magnetic thin films and devices using thermal gradients applied via suspended Si-N membranes |
| title_fullStr | Measurement and control of magnetic thin films and devices using thermal gradients applied via suspended Si-N membranes |
| title_full_unstemmed | Measurement and control of magnetic thin films and devices using thermal gradients applied via suspended Si-N membranes |
| title_short | Measurement and control of magnetic thin films and devices using thermal gradients applied via suspended Si-N membranes |
| title_sort | measurement and control of magnetic thin films and devices using thermal gradients applied via suspended si n membranes |
| topic | Seebeck Coefficient; thermal conductivity thin films spin transport |
| url | https://www.tandfonline.com/doi/10.1080/14686996.2025.2531735 |
| work_keys_str_mv | AT blzink measurementandcontrolofmagneticthinfilmsanddevicesusingthermalgradientsappliedviasuspendedsinmembranes |