Measurement and control of magnetic thin films and devices using thermal gradients applied via suspended Si-N membranes

Magnetic thin films and nanostructures present a unique challenge for a range of thermal measurements, with important consequences for both fundamental physics and material science and applications. This paper reviews the unique capabilities for measurement and control of these systems using thermal...

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Main Author: B. L. Zink
Format: Article
Language:English
Published: Taylor & Francis Group 2025-12-01
Series:Science and Technology of Advanced Materials
Subjects:
Online Access:https://www.tandfonline.com/doi/10.1080/14686996.2025.2531735
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_version_ 1849339609963560960
author B. L. Zink
author_facet B. L. Zink
author_sort B. L. Zink
collection DOAJ
description Magnetic thin films and nanostructures present a unique challenge for a range of thermal measurements, with important consequences for both fundamental physics and material science and applications. This paper reviews the unique capabilities for measurement and control of these systems using thermal gradients applied using micro- and nanofabricated silicon-nitride membrane platforms. Supporting a thin film or nanostructure removes bulk heat sinks from the tiny structure, enabling otherwise challenging or impossible measurements including thermal conductivity, Seebeck coefficient, Peltier coefficient, magnon drag, both the anomalous and planar Nernst effect, specific heat, and novel manifestations of thermally assisted spin transport. After providing some historical context and motivation and overviewing the design and fabrication of silicon-nitride membrane thermal platforms, example data for each of the measurements above is reviewed, and the paper concludes with a consideration of the outlook for measurements enabled by these techniques.
format Article
id doaj-art-1a5e637c52c34743b3a3b44f38dea8a0
institution Kabale University
issn 1468-6996
1878-5514
language English
publishDate 2025-12-01
publisher Taylor & Francis Group
record_format Article
series Science and Technology of Advanced Materials
spelling doaj-art-1a5e637c52c34743b3a3b44f38dea8a02025-08-20T03:44:05ZengTaylor & Francis GroupScience and Technology of Advanced Materials1468-69961878-55142025-12-0126110.1080/14686996.2025.2531735Measurement and control of magnetic thin films and devices using thermal gradients applied via suspended Si-N membranesB. L. Zink0Department of Physics and Astronomy, University of Denver, Denver, CO, USAMagnetic thin films and nanostructures present a unique challenge for a range of thermal measurements, with important consequences for both fundamental physics and material science and applications. This paper reviews the unique capabilities for measurement and control of these systems using thermal gradients applied using micro- and nanofabricated silicon-nitride membrane platforms. Supporting a thin film or nanostructure removes bulk heat sinks from the tiny structure, enabling otherwise challenging or impossible measurements including thermal conductivity, Seebeck coefficient, Peltier coefficient, magnon drag, both the anomalous and planar Nernst effect, specific heat, and novel manifestations of thermally assisted spin transport. After providing some historical context and motivation and overviewing the design and fabrication of silicon-nitride membrane thermal platforms, example data for each of the measurements above is reviewed, and the paper concludes with a consideration of the outlook for measurements enabled by these techniques.https://www.tandfonline.com/doi/10.1080/14686996.2025.2531735Seebeck Coefficient; thermal conductivitythin filmsspin transport
spellingShingle B. L. Zink
Measurement and control of magnetic thin films and devices using thermal gradients applied via suspended Si-N membranes
Science and Technology of Advanced Materials
Seebeck Coefficient; thermal conductivity
thin films
spin transport
title Measurement and control of magnetic thin films and devices using thermal gradients applied via suspended Si-N membranes
title_full Measurement and control of magnetic thin films and devices using thermal gradients applied via suspended Si-N membranes
title_fullStr Measurement and control of magnetic thin films and devices using thermal gradients applied via suspended Si-N membranes
title_full_unstemmed Measurement and control of magnetic thin films and devices using thermal gradients applied via suspended Si-N membranes
title_short Measurement and control of magnetic thin films and devices using thermal gradients applied via suspended Si-N membranes
title_sort measurement and control of magnetic thin films and devices using thermal gradients applied via suspended si n membranes
topic Seebeck Coefficient; thermal conductivity
thin films
spin transport
url https://www.tandfonline.com/doi/10.1080/14686996.2025.2531735
work_keys_str_mv AT blzink measurementandcontrolofmagneticthinfilmsanddevicesusingthermalgradientsappliedviasuspendedsinmembranes