Intelligent Closed-Loop Fluxgate Current Sensor Using Digital Proportional–Integral–Derivative Control with Single-Neuron Pre-Optimization

This paper presents a microcontroller-controlled closed-loop fluxgate current sensor utilizing digital proportional–integral–derivative (PID) control with a single-neuron-based self-pre-optimization algorithm. The digital PID controller within the microcontroller (MCU) regulates the drive circuit to...

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Bibliographic Details
Main Authors: Qiankun Song, Jigou Liu, Marcelo Lobo Heldwein, Stefan Klaß
Format: Article
Language:English
Published: MDPI AG 2025-03-01
Series:Signals
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Online Access:https://www.mdpi.com/2624-6120/6/2/14
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Summary:This paper presents a microcontroller-controlled closed-loop fluxgate current sensor utilizing digital proportional–integral–derivative (PID) control with a single-neuron-based self-pre-optimization algorithm. The digital PID controller within the microcontroller (MCU) regulates the drive circuit to generate a feedback current in the feedback winding based on the zero-flux principle in a closed-loop system. This feedback current is proportional to the measured external current, thereby achieving magnetic compensation. Although PID parameters can be determined using heuristic approaches, empirical formulas, or model-based methods, these techniques are often labor-intensive and time-consuming. To address this challenge, this study implements a single-neuron-based self-pre-optimization algorithm for PID parameters, which autonomously identifies the optimal values for the closed-loop system. Once the PID parameters are optimized, a conventional positional PID algorithm is employed for the closed-loop control of the fluxgate current sensor. The experimental results show that the developed digital closed-loop fluxgate sensor has a non-linearity within 0.1% at the full scale in the measuring ranges of 0–1 A and 0–10 A DC current, with an effective response time of approximately 120 ms. The limitation of the sensors’ response time is found to be ascribed to its open-loop measuring circuit.
ISSN:2624-6120