On the profile characteristics of technical surfaces as applied to nanoroughness
The parameters of the structure of a technical surface at the nanoscale level, determined by the profile method, are considered. The possibility of applying the parameters determined in accordance with domestic and international standards for the roughness profile (microscale level) to the character...
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| Main Authors: | , |
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| Format: | Article |
| Language: | Russian |
| Published: |
Tver State University
2024-12-01
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| Series: | Физико-химические аспекты изучения кластеров, наноструктур и наноматериалов |
| Subjects: | |
| Online Access: | https://physchemaspects.ru/2024/doi-10-26456-pcascnn-2024-16-643/?lang=en |
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