Study on the Stress and Warpage of Flip Chip Package Under Current Crowding

In order to study the influence of current accumulation on flip chip packaging a three-dimensional package model of flip chip is built and the electro-thermal and thermal-structure couplings are analyzed with finite element technique to obtain the temperature distribution stress distribution and dis...

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Bibliographic Details
Main Author: SHE Chenhui; YANG Longlong; TAN Lipeng; LIU Peisheng
Format: Article
Language:English
Published: Editorial Department of Journal of Nantong University (Natural Science Edition) 2020-12-01
Series:Nantong Daxue xuebao. Ziran kexue ban
Subjects:
Online Access:https://ngzke.cbpt.cnki.net/portal/journal/portal/client/paper/50ad9cf4d19ff041a558ad3e20bfc69b
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