Soldatov, I., Ozer, B., Aswartham, S., Selter, S., Veyrat, L., Buchner, B., & Schafer, R. Wide-Field Kerr Microscopy and Magnetometry on Cr₂Ge₂Te₆ Exfoliated van-der-Waals Flakes. IEEE.
Chicago Style (17th ed.) CitationSoldatov, Ivan, Burak Ozer, Saicharan Aswartham, Sebastian Selter, Louis Veyrat, Bernd Buchner, and Rudolf Schafer. Wide-Field Kerr Microscopy and Magnetometry on Cr₂Ge₂Te₆ Exfoliated Van-der-Waals Flakes. IEEE.
MLA (9th ed.) CitationSoldatov, Ivan, et al. Wide-Field Kerr Microscopy and Magnetometry on Cr₂Ge₂Te₆ Exfoliated Van-der-Waals Flakes. IEEE.
Warning: These citations may not always be 100% accurate.