A novel modeling and analysis of mechanical properties of single-component thermal conductive silica gel

Abstract Single-component thermal conductive silica gel (S-TCSG) is a new type of thermal conductive material for packaging electronic components in high-performance printed circuit boards. Its mechanical properties can lead to excessive deformation of printed circuit boards or even solder joint fra...

Full description

Saved in:
Bibliographic Details
Main Authors: Yuezhen Wang, Xiaoguang Li, Zhifeng Liu, Zhichao Jiang, Zhijie Li, Ying Li
Format: Article
Language:English
Published: Nature Portfolio 2025-04-01
Series:Scientific Reports
Subjects:
Online Access:https://doi.org/10.1038/s41598-025-99953-2
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1849314849939521536
author Yuezhen Wang
Xiaoguang Li
Zhifeng Liu
Zhichao Jiang
Zhijie Li
Ying Li
author_facet Yuezhen Wang
Xiaoguang Li
Zhifeng Liu
Zhichao Jiang
Zhijie Li
Ying Li
author_sort Yuezhen Wang
collection DOAJ
description Abstract Single-component thermal conductive silica gel (S-TCSG) is a new type of thermal conductive material for packaging electronic components in high-performance printed circuit boards. Its mechanical properties can lead to excessive deformation of printed circuit boards or even solder joint fracture during screw fastening or falling. In this paper, an experimental program was developed to study the mechanical properties of the S-TCSG, such as cushioning property, creep and stress relaxation. The relationship model is established between cushioning coefficient, compression stress and compression strain on the basis of the compression stress-strain test. In addition, the time-varying laws of the compression creep and stress relaxation of the S-TCSG were studied experimentally. The elastic modulus, relaxation modulus and creep compliance can be obtained based on the experimental data. A nonlinear finite element model (FEM) of the S-TCSG is established. Furthermore, the influence of gel thickness on stress distribution is analyzed in screw tightening. A mathematical model is proposed to characterize the relationship between gel thickness, compressive stress and displacement load. This study is of great practical significance to the rationality of coating thickness of the S-TCSG and the performance improvement of printed circuit boards.
format Article
id doaj-art-0c87803c9f1243e6af04e6eabffc4012
institution Kabale University
issn 2045-2322
language English
publishDate 2025-04-01
publisher Nature Portfolio
record_format Article
series Scientific Reports
spelling doaj-art-0c87803c9f1243e6af04e6eabffc40122025-08-20T03:52:19ZengNature PortfolioScientific Reports2045-23222025-04-0115112010.1038/s41598-025-99953-2A novel modeling and analysis of mechanical properties of single-component thermal conductive silica gelYuezhen Wang0Xiaoguang Li1Zhifeng Liu2Zhichao Jiang3Zhijie Li4Ying Li5School of Liberal Arts and Sciences, North China Institute of Aerospace EngineeringSchool of Mechanical and Electrical Engineering, North China Institute of Aerospace EngineeringKey Laboratory of CNC Equipment Reliability, Ministry of Education, School of Mechanical and Aerospace Engineering, Jilin UniversitySchool of Liberal Arts and Sciences, North China Institute of Aerospace EngineeringSchool of Mechanical and Electrical Engineering, North China Institute of Aerospace EngineeringInstitute of Advanced Manufacturing and Intelligent Technology, Faculty of Materials and Manufacturing, Beijing University of TechnologyAbstract Single-component thermal conductive silica gel (S-TCSG) is a new type of thermal conductive material for packaging electronic components in high-performance printed circuit boards. Its mechanical properties can lead to excessive deformation of printed circuit boards or even solder joint fracture during screw fastening or falling. In this paper, an experimental program was developed to study the mechanical properties of the S-TCSG, such as cushioning property, creep and stress relaxation. The relationship model is established between cushioning coefficient, compression stress and compression strain on the basis of the compression stress-strain test. In addition, the time-varying laws of the compression creep and stress relaxation of the S-TCSG were studied experimentally. The elastic modulus, relaxation modulus and creep compliance can be obtained based on the experimental data. A nonlinear finite element model (FEM) of the S-TCSG is established. Furthermore, the influence of gel thickness on stress distribution is analyzed in screw tightening. A mathematical model is proposed to characterize the relationship between gel thickness, compressive stress and displacement load. This study is of great practical significance to the rationality of coating thickness of the S-TCSG and the performance improvement of printed circuit boards.https://doi.org/10.1038/s41598-025-99953-2Bolted jointsSingle-component thermal conductive silica gelCushioning propertyCreepStress relaxation
spellingShingle Yuezhen Wang
Xiaoguang Li
Zhifeng Liu
Zhichao Jiang
Zhijie Li
Ying Li
A novel modeling and analysis of mechanical properties of single-component thermal conductive silica gel
Scientific Reports
Bolted joints
Single-component thermal conductive silica gel
Cushioning property
Creep
Stress relaxation
title A novel modeling and analysis of mechanical properties of single-component thermal conductive silica gel
title_full A novel modeling and analysis of mechanical properties of single-component thermal conductive silica gel
title_fullStr A novel modeling and analysis of mechanical properties of single-component thermal conductive silica gel
title_full_unstemmed A novel modeling and analysis of mechanical properties of single-component thermal conductive silica gel
title_short A novel modeling and analysis of mechanical properties of single-component thermal conductive silica gel
title_sort novel modeling and analysis of mechanical properties of single component thermal conductive silica gel
topic Bolted joints
Single-component thermal conductive silica gel
Cushioning property
Creep
Stress relaxation
url https://doi.org/10.1038/s41598-025-99953-2
work_keys_str_mv AT yuezhenwang anovelmodelingandanalysisofmechanicalpropertiesofsinglecomponentthermalconductivesilicagel
AT xiaoguangli anovelmodelingandanalysisofmechanicalpropertiesofsinglecomponentthermalconductivesilicagel
AT zhifengliu anovelmodelingandanalysisofmechanicalpropertiesofsinglecomponentthermalconductivesilicagel
AT zhichaojiang anovelmodelingandanalysisofmechanicalpropertiesofsinglecomponentthermalconductivesilicagel
AT zhijieli anovelmodelingandanalysisofmechanicalpropertiesofsinglecomponentthermalconductivesilicagel
AT yingli anovelmodelingandanalysisofmechanicalpropertiesofsinglecomponentthermalconductivesilicagel
AT yuezhenwang novelmodelingandanalysisofmechanicalpropertiesofsinglecomponentthermalconductivesilicagel
AT xiaoguangli novelmodelingandanalysisofmechanicalpropertiesofsinglecomponentthermalconductivesilicagel
AT zhifengliu novelmodelingandanalysisofmechanicalpropertiesofsinglecomponentthermalconductivesilicagel
AT zhichaojiang novelmodelingandanalysisofmechanicalpropertiesofsinglecomponentthermalconductivesilicagel
AT zhijieli novelmodelingandanalysisofmechanicalpropertiesofsinglecomponentthermalconductivesilicagel
AT yingli novelmodelingandanalysisofmechanicalpropertiesofsinglecomponentthermalconductivesilicagel