Pattern recognition applying LDA and LR to optoelectronic signals of optical scanning systems
This paper is a follow-up to previous researches already published regarding the minimization of optical-electrical noise in optical scanning systems OSS, by the implementation of computational techniques for pattern recognition generated by each reference source used to indicate a coordinate that t...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | Spanish |
| Published: |
Universitat Politècnica de València
2020-09-01
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| Series: | Revista Iberoamericana de Automática e Informática Industrial RIAI |
| Subjects: | |
| Online Access: | https://polipapers.upv.es/index.php/RIAI/article/view/12385 |
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| Summary: | This paper is a follow-up to previous researches already published regarding the minimization of optical-electrical noise in optical scanning systems OSS, by the implementation of computational techniques for pattern recognition generated by each reference source used to indicate a coordinate that the OSS will be monitoring. Techniques such as linear discriminant analysis LDA and linear regression LR were implemented in order to discriminate the signals caused by other sources different to the references. In order to enhance the efficiency of these models was implemented linear predictive coding LPC and quantiles as features extractors. The results were encouraging with rates of recognition greater than 91.2 %, reaching in some cases an accuracy of 100 %. |
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| ISSN: | 1697-7912 1697-7920 |