Genome-wide association study of Northern corn leaf blight (NCLB) resistance using temperate and subtropical maize recombinant inbred lines

Genome-wide association study of Northern corn leaf blight (NCLB) resistance using temperate and subtropical maize recombinant inbred lines

Abstract Background Northern corn leaf blight (NCLB) is a foliar disease in maize caused by the fungus Setosphaeria turcica, which severely impacts maize production. Genetic studies can help mitigate the effects of NCLB by developing maize resistant varieties and enhancing overall crop yield. Result...

Full description

Saved in:
Bibliographic Details
Main Authors: Xiaodong Gong, Fuyan Jiang, Ranjan K. Shaw, Jiachen Sun, Tao Dai, Yaqi Bi, Yanhui Pan, Jiao Kong, Haiyang Zong, Xiaoping Yang, Babar Ijaz, Xingming Fan
Format: Article
Language:English
Published: BMC 2025-07-01
Series:BMC Genomics
Subjects:
Maize
NCLB
Setosphaeria turcica
GWAS
QRT-PCR
Online Access:https://doi.org/10.1186/s12864-025-11806-4
Tags: Add Tag
No Tags, Be the first to tag this record!

Similar Items

Similar Items