Microlens Array-Based Beam Profile and Wavefront Sensor With Physical Constraint Learning
The beam profile and wavefront characteristics of laser beams are essential for numerous laser applications, including micromachining and microfabrication. However, conventional wavefront sensors, such as the Shack-Hartmann wavefront sensor (SHWS), are limited by reduced accuracy in detecting local...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Photonics Journal |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10967538/ |
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