Murakami, R., Matsushita, Y., Nagata, K., Shouno, H., & Yoshikawa, H. Bayesian estimation to identify crystalline phase structures for X-ray diffraction pattern analysis. Taylor & Francis Group.
Chicago Style (17th ed.) CitationMurakami, Ryo, Yoshitaka Matsushita, Kenji Nagata, Hayaru Shouno, and Hideki Yoshikawa. Bayesian Estimation to Identify Crystalline Phase Structures for X-ray Diffraction Pattern Analysis. Taylor & Francis Group.
MLA (9th ed.) CitationMurakami, Ryo, et al. Bayesian Estimation to Identify Crystalline Phase Structures for X-ray Diffraction Pattern Analysis. Taylor & Francis Group.
Warning: These citations may not always be 100% accurate.